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A thermal activation model for 1/f{hook}y noise in Si-MOSFETs
Charles Surya, Thomas Y. Hsiang
Department of Electrical and Computer Engineering
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peer-review
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Chemical Compounds
Surface potential
Oxides
Power spectral density
Power spectrum
Scattering
Chemical activation
Modulation
Electric potential
Hot Temperature
Temperature
Engineering & Materials Science
Surface potential
Power spectral density
Power spectrum
Scattering
Chemical activation
Oxides
Modulation
Electric potential
Hot Temperature
Temperature
Physics & Astronomy
hooks
activation
field effect transistors
noise spectra
power spectra
traps
modulation
temperature dependence
oxides
electric potential
scattering