A time-of-flight mass spectrometric study of laser fluence dependencies in SnO2 ablation: Implications for pulsed laser deposited tin oxide thin films

Haiyan Fan, Wei Ho, Scott A. Reid

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

We report on a time-of-flight mass spectrometric study of laser fluence dependencies in the 532nm ablation of SnO2 targets. At all fluences investigated, SnO and Sn2O2 are the primary neutral gas-phase species. The relative yield of neutral tin-containing species increases exponentially up to a fluence of ∼1.9×108Wcm -2, and saturates at higher fluences. The yield of metal oxide clusters (primarily Sn2O2, Sn4O4) increases in the saturated region, while the yield of bare metal species (primarily Sn, Sn2) decreases. In contrast, the peak kinetic energy of the primary neutral ablated species is insensitive to laser fluence in this range. These results support the hypothesis that the initial Sn:O stoichiometry of amorphous SnOx films grown in vacuum using pulsed laser deposition (PLD) plays an important role in the formation of α-SnO during post-deposition annealing.

Original languageEnglish
Pages (from-to)11-17
Number of pages7
JournalInternational Journal of Mass Spectrometry
Volume230
Issue number1
DOIs
Publication statusPublished - Nov 1 2003

Keywords

  • Ablation
  • Laser

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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