Advanced surface polishing for accelerator technology using ion beams

Z. Insepov; J. Norem; A. Hassanein; A. T. Wu

doi:10.1063/1.3120076

Advanced surface polishing for accelerator technology using ion beams

Z. Insepov, J. Norem, A. Hassanein, A. T. Wu

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1 Citation (Scopus)

Abstract

A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O₂ and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

Original language	English
Pages (from-to)	46-50
Number of pages	5
Journal	AIP Conference Proceedings
Volume	1099
DOIs	https://doi.org/10.1063/1.3120076
Publication status	Published - 2009
Event	20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008 - Fort Worth, TX, United States Duration: Aug 10 2008 → Aug 15 2008

Keywords

Gas cluster ion beam
Molecular dynamics
Rf vacuum breakdown mitigation
Surface smoothing

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.3120076

Cite this

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title = "Advanced surface polishing for accelerator technology using ion beams",

abstract = "A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.",

keywords = "Gas cluster ion beam, Molecular dynamics, Rf vacuum breakdown mitigation, Surface smoothing",

author = "Z. Insepov and J. Norem and A. Hassanein and Wu, {A. T.}",

year = "2009",

doi = "10.1063/1.3120076",

language = "English",

volume = "1099",

pages = "46--50",

journal = "AIP Conference Proceedings",

issn = "0094-243X",

publisher = "American Institute of Physics Publising LLC",

note = "20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008 ; Conference date: 10-08-2008 Through 15-08-2008",

}

TY - JOUR

T1 - Advanced surface polishing for accelerator technology using ion beams

AU - Insepov, Z.

AU - Norem, J.

AU - Hassanein, A.

AU - Wu, A. T.

PY - 2009

Y1 - 2009

N2 - A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

AB - A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

KW - Gas cluster ion beam

KW - Molecular dynamics

KW - Rf vacuum breakdown mitigation

KW - Surface smoothing

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DO - 10.1063/1.3120076

M3 - Conference article

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VL - 1099

SP - 46

EP - 50

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

SN - 0094-243X

T2 - 20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008

Y2 - 10 August 2008 through 15 August 2008

ER -

Advanced surface polishing for accelerator technology using ion beams

Abstract

Keywords

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