Advanced surface polishing for accelerator technology using ion beams

Z. Insepov, J. Norem, A. Hassanein, A. T. Wu

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

Original languageEnglish
Pages (from-to)46-50
Number of pages5
JournalAIP Conference Proceedings
Volume1099
DOIs
Publication statusPublished - 2009
Externally publishedYes

Fingerprint

polishing
accelerators
ion beams
gases
cavities
dark current
surface treatment
metal surfaces
Q factors
stainless steels
field emission
electron microscopy
emitters
direct current
microscopy
irradiation
oxides
electric potential
oxygen

Keywords

  • Gas cluster ion beam
  • Molecular dynamics
  • Rf vacuum breakdown mitigation
  • Surface smoothing

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Advanced surface polishing for accelerator technology using ion beams. / Insepov, Z.; Norem, J.; Hassanein, A.; Wu, A. T.

In: AIP Conference Proceedings, Vol. 1099, 2009, p. 46-50.

Research output: Contribution to journalArticle

Insepov, Z. ; Norem, J. ; Hassanein, A. ; Wu, A. T. / Advanced surface polishing for accelerator technology using ion beams. In: AIP Conference Proceedings. 2009 ; Vol. 1099. pp. 46-50.
@article{74a4d263cf4c45d4a9f6c753fbf6d15e,
title = "Advanced surface polishing for accelerator technology using ion beams",
abstract = "A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.",
keywords = "Gas cluster ion beam, Molecular dynamics, Rf vacuum breakdown mitigation, Surface smoothing",
author = "Z. Insepov and J. Norem and A. Hassanein and Wu, {A. T.}",
year = "2009",
doi = "10.1063/1.3120076",
language = "English",
volume = "1099",
pages = "46--50",
journal = "AIP Conference Proceedings",
issn = "0094-243X",
publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Advanced surface polishing for accelerator technology using ion beams

AU - Insepov, Z.

AU - Norem, J.

AU - Hassanein, A.

AU - Wu, A. T.

PY - 2009

Y1 - 2009

N2 - A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

AB - A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

KW - Gas cluster ion beam

KW - Molecular dynamics

KW - Rf vacuum breakdown mitigation

KW - Surface smoothing

UR - http://www.scopus.com/inward/record.url?scp=65349124720&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=65349124720&partnerID=8YFLogxK

U2 - 10.1063/1.3120076

DO - 10.1063/1.3120076

M3 - Article

VL - 1099

SP - 46

EP - 50

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

SN - 0094-243X

ER -