Advanced surface polishing for accelerator technology using ion beams

Z. Insepov; J. Norem; A. Hassanein; A. T. Wu

doi:10.1063/1.3120076

Advanced surface polishing for accelerator technology using ion beams

Z. Insepov, J. Norem, A. Hassanein, A. T. Wu

Office of the Provost

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O₂ and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

Original language	English
Pages (from-to)	46-50
Number of pages	5
Journal	AIP Conference Proceedings
Volume	1099
DOIs	https://doi.org/10.1063/1.3120076
Publication status	Published - 2009
Event	20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008 - Fort Worth, TX, United States Duration: Aug 10 2008 → Aug 15 2008

Keywords

Gas cluster ion beam
Molecular dynamics
Rf vacuum breakdown mitigation
Surface smoothing

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.3120076

Fingerprint Dive into the research topics of 'Advanced surface polishing for accelerator technology using ion beams'. Together they form a unique fingerprint.

Cite this

@article{74a4d263cf4c45d4a9f6c753fbf6d15e,

title = "Advanced surface polishing for accelerator technology using ion beams",

abstract = "A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.",

keywords = "Gas cluster ion beam, Molecular dynamics, Rf vacuum breakdown mitigation, Surface smoothing",

author = "Z. Insepov and J. Norem and A. Hassanein and Wu, {A. T.}",

note = "Copyright: Copyright 2009 Elsevier B.V., All rights reserved.; 20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008 ; Conference date: 10-08-2008 Through 15-08-2008",

year = "2009",

doi = "10.1063/1.3120076",

language = "English",

volume = "1099",

pages = "46--50",

journal = "AIP Conference Proceedings",

issn = "0094-243X",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Advanced surface polishing for accelerator technology using ion beams

AU - Insepov, Z.

AU - Norem, J.

AU - Hassanein, A.

AU - Wu, A. T.

PY - 2009

Y1 - 2009

N2 - A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

AB - A gas cluster ion beam (GCIB) technology was successfully applied to surface treatment of Cu, stainless steel, Ti, and Nb samples and to Nb rf-cavities by using accelerated cluster ion beams of Ar, O2 and combinations of them, with accelerating voltages up to 35 kV. DC field emission (dark current) measurements and electron microscopy were used to investigate metal surfaces treated by GCIB. The experimental results showed that GCIB technique can significantly reduce the number of field emitters and can change the structure of the Nb oxide layer on the surface. The RF tests of the GCIB-treated Nb rf-cavities showed improvement of the quality factor Q at 4.5 K. The superconducting gap was also enhanced by using the oxygen GCIB irradiation exposure.

KW - Gas cluster ion beam

KW - Molecular dynamics

KW - Rf vacuum breakdown mitigation

KW - Surface smoothing

UR - http://www.scopus.com/inward/record.url?scp=65349124720&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=65349124720&partnerID=8YFLogxK

U2 - 10.1063/1.3120076

DO - 10.1063/1.3120076

M3 - Conference article

AN - SCOPUS:65349124720

VL - 1099

SP - 46

EP - 50

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

SN - 0094-243X

T2 - 20th International Conference on the Application of Accelerators in Research and Industry, CAARI 2008

Y2 - 10 August 2008 through 15 August 2008

ER -