Abstract
The direct current (dc) and radiofrequency (rf) performance of highly linear doped channel field effect transistors (DCFET) with large current density on AlAs0.56Sb0.44/In0.53Ga0.47As lattice matched to InP substrate are reported. The samples were grown using molecular beam epitaxy (MBE). The noise performance of the device is presented and the various pathways in terms of the device structure needed for further improvement in linearity are discussed.
Original language | English |
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Pages | 152-153 |
Number of pages | 2 |
Publication status | Published - Dec 1 1999 |
Event | Proceedings of the 1999 57th Annual Device Research Conference Digest (DRC) - Santa Barbara, CA, USA Duration: Jun 28 1999 → Jun 30 1999 |
Conference
Conference | Proceedings of the 1999 57th Annual Device Research Conference Digest (DRC) |
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City | Santa Barbara, CA, USA |
Period | 6/28/99 → 6/30/99 |
ASJC Scopus subject areas
- Engineering(all)