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Analysis of Normally Incident EM Waves Reflected from a Conformal Meta-surface

    • Higher School of Economics
    • Ajman University

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    This paper reports the conceptualization, and analysis of a geometrical approach to determine the shift in the in-phase reflection of three conformal meta-surfaces (MS). For the proposed approach, a planar array consisting of MS unit cells (MS-UCs) of a given dimension is drawn on a circle of desired radius (r). The path traveled by the reflected and incident EM wave in terms of an electrical length results in the shift of reflection angle. For the validation purpose, the conformed arrays are simulated under x-and y-polarized EM waves. The sum of the incident and reflected phases resulting in total shift is determined theoretically and compared with the simulated shifts of the three arrays. Furthermore, one of the conformed arrays is experimentally evaluated under the TEM incidence and compared with the theoretical and simulated result. The excellent agreement between the theoretical and measured results demonstrates the effectiveness of the proposed work.

    Original languageEnglish
    Title of host publication2022 16th European Conference on Antennas and Propagation, EuCAP 2022
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9788831299046
    Publication statusPublished - 2022
    Event16th European Conference on Antennas and Propagation, EuCAP 2022 - Madrid, Spain
    Duration: Mar 27 2022Apr 1 2022

    Publication series

    Name2022 16th European Conference on Antennas and Propagation, EuCAP 2022

    Conference

    Conference16th European Conference on Antennas and Propagation, EuCAP 2022
    Country/TerritorySpain
    CityMadrid
    Period3/27/224/1/22

    Keywords

    • Antenna
    • electrical length
    • electromagnetic band-gap surface (EBG)
    • meta-surface
    • perfect electric conductor
    • reflection phase

    ASJC Scopus subject areas

    • Computer Networks and Communications
    • Electronic, Optical and Magnetic Materials
    • Instrumentation
    • Radiation

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