Atomic force microscopy study of cross-sections of perovskite layers

D. Migunov, K. Eidelman, A. Kozmin, D. Saranin, I. Ermanova, D. Gudkov, Alexander Alekseev

Research output: Contribution to journalArticle

Abstract

Improvement of methods for imaging of the volume structure of photoactive layers is one of the important directions towards development of highly efficient solar cells. In particular, volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study, a perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by Atomic Force Microscopy (AFM) methods. The proposed approach allows using advances of AFM for imaging structure of perovskites in volume. Two different types of perovskite layers was investigated: FAPbBr 3 and MAPbBr 3 . The heterogeneous structure inside film, which consist of large crystals penetrating the film as well as small particles with sizes of several tens nanometers, is typical for FAPbBr 3 . The ordered nanocrystalline structure with nanocrystals oriented at 45 degree to film surface is observed in MAPbBr 3 . An optimized sample preparation route, which includes FIB surface polishing by low energy Ga ions at the angles around 10 degree to surface plane, is described and optimal parameters of surface treatment are discussed. Use of AFM phase contrast method provides high contrast imaging of perovskite structure due to strong dependence of phase shift of oscillating probe on materials properties. The described method of imaging can be used for controllable tuning of perovskite structure by changes of the sample preparation routes.

Original languageEnglish
Pages (from-to)83-87
Number of pages5
JournalEurasian Chemico-Technological Journal
Volume21
Issue number1
DOIs
Publication statusPublished - Jan 1 2019

Fingerprint

Perovskite
Atomic force microscopy
atomic force microscopy
Imaging techniques
Focused ion beams
cross sections
solar cells
ion beams
routes
nanostructure (characteristics)
preparation
phase contrast
perovskites
surface treatment
Polishing
polishing
Phase shift
Nanocrystals
Surface treatment
Materials properties

Keywords

  • Atomic force microscopy
  • Cross-section
  • Focused ion beam
  • Nanostructure
  • Perovskite

ASJC Scopus subject areas

  • Chemistry(all)
  • Chemical Engineering(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Migunov, D., Eidelman, K., Kozmin, A., Saranin, D., Ermanova, I., Gudkov, D., & Alekseev, A. (2019). Atomic force microscopy study of cross-sections of perovskite layers. Eurasian Chemico-Technological Journal, 21(1), 83-87. https://doi.org/10.18321/ectj795

Atomic force microscopy study of cross-sections of perovskite layers. / Migunov, D.; Eidelman, K.; Kozmin, A.; Saranin, D.; Ermanova, I.; Gudkov, D.; Alekseev, Alexander.

In: Eurasian Chemico-Technological Journal, Vol. 21, No. 1, 01.01.2019, p. 83-87.

Research output: Contribution to journalArticle

Migunov, D, Eidelman, K, Kozmin, A, Saranin, D, Ermanova, I, Gudkov, D & Alekseev, A 2019, 'Atomic force microscopy study of cross-sections of perovskite layers', Eurasian Chemico-Technological Journal, vol. 21, no. 1, pp. 83-87. https://doi.org/10.18321/ectj795
Migunov D, Eidelman K, Kozmin A, Saranin D, Ermanova I, Gudkov D et al. Atomic force microscopy study of cross-sections of perovskite layers. Eurasian Chemico-Technological Journal. 2019 Jan 1;21(1):83-87. https://doi.org/10.18321/ectj795
Migunov, D. ; Eidelman, K. ; Kozmin, A. ; Saranin, D. ; Ermanova, I. ; Gudkov, D. ; Alekseev, Alexander. / Atomic force microscopy study of cross-sections of perovskite layers. In: Eurasian Chemico-Technological Journal. 2019 ; Vol. 21, No. 1. pp. 83-87.
@article{251a42cd74414f4a997a217e87f53b2a,
title = "Atomic force microscopy study of cross-sections of perovskite layers",
abstract = "Improvement of methods for imaging of the volume structure of photoactive layers is one of the important directions towards development of highly efficient solar cells. In particular, volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study, a perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by Atomic Force Microscopy (AFM) methods. The proposed approach allows using advances of AFM for imaging structure of perovskites in volume. Two different types of perovskite layers was investigated: FAPbBr 3 and MAPbBr 3 . The heterogeneous structure inside film, which consist of large crystals penetrating the film as well as small particles with sizes of several tens nanometers, is typical for FAPbBr 3 . The ordered nanocrystalline structure with nanocrystals oriented at 45 degree to film surface is observed in MAPbBr 3 . An optimized sample preparation route, which includes FIB surface polishing by low energy Ga ions at the angles around 10 degree to surface plane, is described and optimal parameters of surface treatment are discussed. Use of AFM phase contrast method provides high contrast imaging of perovskite structure due to strong dependence of phase shift of oscillating probe on materials properties. The described method of imaging can be used for controllable tuning of perovskite structure by changes of the sample preparation routes.",
keywords = "Atomic force microscopy, Cross-section, Focused ion beam, Nanostructure, Perovskite",
author = "D. Migunov and K. Eidelman and A. Kozmin and D. Saranin and I. Ermanova and D. Gudkov and Alexander Alekseev",
year = "2019",
month = "1",
day = "1",
doi = "10.18321/ectj795",
language = "English",
volume = "21",
pages = "83--87",
journal = "Eurasian Chemico-Technological Journal",
issn = "1562-3920",
publisher = "al-Farabi Kazakh State National University",
number = "1",

}

TY - JOUR

T1 - Atomic force microscopy study of cross-sections of perovskite layers

AU - Migunov, D.

AU - Eidelman, K.

AU - Kozmin, A.

AU - Saranin, D.

AU - Ermanova, I.

AU - Gudkov, D.

AU - Alekseev, Alexander

PY - 2019/1/1

Y1 - 2019/1/1

N2 - Improvement of methods for imaging of the volume structure of photoactive layers is one of the important directions towards development of highly efficient solar cells. In particular, volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study, a perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by Atomic Force Microscopy (AFM) methods. The proposed approach allows using advances of AFM for imaging structure of perovskites in volume. Two different types of perovskite layers was investigated: FAPbBr 3 and MAPbBr 3 . The heterogeneous structure inside film, which consist of large crystals penetrating the film as well as small particles with sizes of several tens nanometers, is typical for FAPbBr 3 . The ordered nanocrystalline structure with nanocrystals oriented at 45 degree to film surface is observed in MAPbBr 3 . An optimized sample preparation route, which includes FIB surface polishing by low energy Ga ions at the angles around 10 degree to surface plane, is described and optimal parameters of surface treatment are discussed. Use of AFM phase contrast method provides high contrast imaging of perovskite structure due to strong dependence of phase shift of oscillating probe on materials properties. The described method of imaging can be used for controllable tuning of perovskite structure by changes of the sample preparation routes.

AB - Improvement of methods for imaging of the volume structure of photoactive layers is one of the important directions towards development of highly efficient solar cells. In particular, volume structure of photoactive layer has critical influence on perovskite solar cell performance and life time. In this study, a perovskite photoactive layer cross-section was prepared by using Focused Ion Beam (FIB) and imaged by Atomic Force Microscopy (AFM) methods. The proposed approach allows using advances of AFM for imaging structure of perovskites in volume. Two different types of perovskite layers was investigated: FAPbBr 3 and MAPbBr 3 . The heterogeneous structure inside film, which consist of large crystals penetrating the film as well as small particles with sizes of several tens nanometers, is typical for FAPbBr 3 . The ordered nanocrystalline structure with nanocrystals oriented at 45 degree to film surface is observed in MAPbBr 3 . An optimized sample preparation route, which includes FIB surface polishing by low energy Ga ions at the angles around 10 degree to surface plane, is described and optimal parameters of surface treatment are discussed. Use of AFM phase contrast method provides high contrast imaging of perovskite structure due to strong dependence of phase shift of oscillating probe on materials properties. The described method of imaging can be used for controllable tuning of perovskite structure by changes of the sample preparation routes.

KW - Atomic force microscopy

KW - Cross-section

KW - Focused ion beam

KW - Nanostructure

KW - Perovskite

UR - http://www.scopus.com/inward/record.url?scp=85065908070&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85065908070&partnerID=8YFLogxK

U2 - 10.18321/ectj795

DO - 10.18321/ectj795

M3 - Article

VL - 21

SP - 83

EP - 87

JO - Eurasian Chemico-Technological Journal

JF - Eurasian Chemico-Technological Journal

SN - 1562-3920

IS - 1

ER -