Automated generation of monitors for pattern contracts

Benjamin Tyler, Jason O. Hallstrom, Neelam Soundarajan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

While the informal style used to describe design patterns has proven valuable, it is also imprecise. To ensure that patterns are applied correctly, we must also have precise pattern characterizations, and tools for determining whether the appropriate implementation requirements are satisfied. To address this problem, we first present a specification language that captures pattern requirements precisely, as well as the ways in which patterns are specialized for use. Second, we present a tool that generates a set of aspect-oriented monitors for a system based on the specifications of the patterns used in its design. The generated aspects are used to monitor the system at runtime to determine whether the appropriate implementation requirements are satisfied.

Original languageEnglish
Title of host publicationProceedings of the ACM Symposium on Applied Computing
Pages1779-1784
Number of pages6
Volume2
Publication statusPublished - 2006
Externally publishedYes
Event2006 ACM Symposium on Applied Computing - Dijon, France
Duration: Apr 23 2006Apr 27 2006

Other

Other2006 ACM Symposium on Applied Computing
CountryFrance
CityDijon
Period4/23/064/27/06

Fingerprint

Specification languages
Specifications

Keywords

  • Aspects
  • Contracts
  • Design patterns
  • Monitoring
  • Specification

ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Tyler, B., Hallstrom, J. O., & Soundarajan, N. (2006). Automated generation of monitors for pattern contracts. In Proceedings of the ACM Symposium on Applied Computing (Vol. 2, pp. 1779-1784)

Automated generation of monitors for pattern contracts. / Tyler, Benjamin; Hallstrom, Jason O.; Soundarajan, Neelam.

Proceedings of the ACM Symposium on Applied Computing. Vol. 2 2006. p. 1779-1784.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tyler, B, Hallstrom, JO & Soundarajan, N 2006, Automated generation of monitors for pattern contracts. in Proceedings of the ACM Symposium on Applied Computing. vol. 2, pp. 1779-1784, 2006 ACM Symposium on Applied Computing, Dijon, France, 4/23/06.
Tyler B, Hallstrom JO, Soundarajan N. Automated generation of monitors for pattern contracts. In Proceedings of the ACM Symposium on Applied Computing. Vol. 2. 2006. p. 1779-1784
Tyler, Benjamin ; Hallstrom, Jason O. ; Soundarajan, Neelam. / Automated generation of monitors for pattern contracts. Proceedings of the ACM Symposium on Applied Computing. Vol. 2 2006. pp. 1779-1784
@inproceedings{575729d7088d4c7babcc5e828714e5c3,
title = "Automated generation of monitors for pattern contracts",
abstract = "While the informal style used to describe design patterns has proven valuable, it is also imprecise. To ensure that patterns are applied correctly, we must also have precise pattern characterizations, and tools for determining whether the appropriate implementation requirements are satisfied. To address this problem, we first present a specification language that captures pattern requirements precisely, as well as the ways in which patterns are specialized for use. Second, we present a tool that generates a set of aspect-oriented monitors for a system based on the specifications of the patterns used in its design. The generated aspects are used to monitor the system at runtime to determine whether the appropriate implementation requirements are satisfied.",
keywords = "Aspects, Contracts, Design patterns, Monitoring, Specification",
author = "Benjamin Tyler and Hallstrom, {Jason O.} and Neelam Soundarajan",
year = "2006",
language = "English",
isbn = "1595931082",
volume = "2",
pages = "1779--1784",
booktitle = "Proceedings of the ACM Symposium on Applied Computing",

}

TY - GEN

T1 - Automated generation of monitors for pattern contracts

AU - Tyler, Benjamin

AU - Hallstrom, Jason O.

AU - Soundarajan, Neelam

PY - 2006

Y1 - 2006

N2 - While the informal style used to describe design patterns has proven valuable, it is also imprecise. To ensure that patterns are applied correctly, we must also have precise pattern characterizations, and tools for determining whether the appropriate implementation requirements are satisfied. To address this problem, we first present a specification language that captures pattern requirements precisely, as well as the ways in which patterns are specialized for use. Second, we present a tool that generates a set of aspect-oriented monitors for a system based on the specifications of the patterns used in its design. The generated aspects are used to monitor the system at runtime to determine whether the appropriate implementation requirements are satisfied.

AB - While the informal style used to describe design patterns has proven valuable, it is also imprecise. To ensure that patterns are applied correctly, we must also have precise pattern characterizations, and tools for determining whether the appropriate implementation requirements are satisfied. To address this problem, we first present a specification language that captures pattern requirements precisely, as well as the ways in which patterns are specialized for use. Second, we present a tool that generates a set of aspect-oriented monitors for a system based on the specifications of the patterns used in its design. The generated aspects are used to monitor the system at runtime to determine whether the appropriate implementation requirements are satisfied.

KW - Aspects

KW - Contracts

KW - Design patterns

KW - Monitoring

KW - Specification

UR - http://www.scopus.com/inward/record.url?scp=33751069786&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33751069786&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:33751069786

SN - 1595931082

SN - 9781595931085

VL - 2

SP - 1779

EP - 1784

BT - Proceedings of the ACM Symposium on Applied Computing

ER -