Automated scanning probe microscopy as a new tool for combinatorial polymer research: Conductive carbon black/poly(dimethylsiloxane) composites

Riadh Neffati, Alexander Alexeev, Sergey Saunin, José C M Brokken-Zijp, Daan Wouters, Stefan Schmatloch, Ulrich S. Schubert, Joachim Loos

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

A systematic investigation into the surface properties of siloxane rubber/carbon black (CB) nanocomposites has been performed, using an automated scanning probe microscope. In this way the influence of CB concentration and curing rate of the siloxane rubber matrix on roughness and conductivity of the composites was studied. Decreasing the curing rate while keeping the CB concentration resulted in a decrease in both roughness and surface conductivity, which can be explained by an additional siloxane-rubber layer formed during curing.

Original languageEnglish
Pages (from-to)113-117
Number of pages5
JournalMacromolecular Rapid Communications
Volume24
Issue number1
DOIs
Publication statusPublished - Jan 24 2003
Externally publishedYes

Fingerprint

Siloxanes
Soot
Scanning probe microscopy
Rubber
Polydimethylsiloxane
Carbon black
Curing
Polymers
Composite materials
Surface roughness
Surface properties
Nanocomposites
Microscopes
Scanning
baysilon

Keywords

  • Automated AFM
  • Carbon black nanocomposites
  • Combinatorial materials research
  • Conductivity
  • High-throughput experimentation
  • Siloxane rubbers

ASJC Scopus subject areas

  • Materials Chemistry
  • Polymers and Plastics

Cite this

Automated scanning probe microscopy as a new tool for combinatorial polymer research : Conductive carbon black/poly(dimethylsiloxane) composites. / Neffati, Riadh; Alexeev, Alexander; Saunin, Sergey; Brokken-Zijp, José C M; Wouters, Daan; Schmatloch, Stefan; Schubert, Ulrich S.; Loos, Joachim.

In: Macromolecular Rapid Communications, Vol. 24, No. 1, 24.01.2003, p. 113-117.

Research output: Contribution to journalArticle

Neffati, Riadh ; Alexeev, Alexander ; Saunin, Sergey ; Brokken-Zijp, José C M ; Wouters, Daan ; Schmatloch, Stefan ; Schubert, Ulrich S. ; Loos, Joachim. / Automated scanning probe microscopy as a new tool for combinatorial polymer research : Conductive carbon black/poly(dimethylsiloxane) composites. In: Macromolecular Rapid Communications. 2003 ; Vol. 24, No. 1. pp. 113-117.
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