Characterization of high-quality MBE-grown GaN films on intermediate-temperature buffer layers

C. F. Zhu, W. K. Fong, B. H. Leung, C. Surya

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

High-quality GaN thin films are grown by rf-plasma assisted molecular beam epitaxy. The quality of the GaN epitaxial layer is significantly improved by using an intermediate-temperature GaN buffer layer (ITBL) in addition to a conventional 20-nm-thick low-temperature buffer layer. The GaN epitaxial layers demonstrate systematic improvements in the electron mobility increasing from 82 cm2V-1s-1, for films grown with just the low-temperature buffer layer, to about 380 cm2V-1s-1 for films grown with an ITBL of thickness 800 nm. The photoluminescence also indicates systematic improvements in the intensity and the full-width-half-maximum with the use of ITBL. Photoreflectance spectra are measured from the GaN films. Detailed analyses of the excitonic transition energy demonstrate that the residual strain relaxes rapidly with the use of ITBL, which is attributed to the observed improvements in the mobility and the PL spectra.

Original languageEnglish
Pages (from-to)495-497
Number of pages3
JournalApplied Physics A: Materials Science and Processing
Volume72
Issue number4
DOIs
Publication statusPublished - Jan 1 2001
Externally publishedYes

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

Fingerprint Dive into the research topics of 'Characterization of high-quality MBE-grown GaN films on intermediate-temperature buffer layers'. Together they form a unique fingerprint.

  • Cite this