Characterization of InGaN/GaN multiple quantum wells grown on sapphire substrates by nano-scale epitaxial lateral overgrowth technique
W. K. Fong, K. K. Leung, Charles Surya
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Fingerprint
Dive into the research topics of 'Characterization of InGaN/GaN multiple quantum wells grown on sapphire substrates by nano-scale epitaxial lateral overgrowth technique'. Together they form a unique fingerprint.