Charge relaxation and gain depletion for candidate secondary electron emission materials

Zeke Insepov; Valentin Ivanov; Jeffrey Elam; Bernhard Adams; H. Frisch

doi:10.1109/NSSMIC.2010.5873957

Charge relaxation and gain depletion for candidate secondary electron emission materials

Zeke Insepov, Valentin Ivanov, Jeffrey Elam, Bernhard Adams, H. Frisch

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Microchannel plates (MCPs) are widely used in photodetectors with a picosecond resolution. Two main characteristics of MCPs, gain and timing resolution, strongly depend on the materials parameters, as well as on the history of electron avalanche evolution. The most important effect that can significantly change the efficiency of an MCP is the effect of saturation of the electronic current, which occurs at high-level input signals. In this paper, the saturation effects are studied numerically, as they are applicable to analysis of large-area, fast photodetectors. It is shown that the saturation effect for short pulses can be reduced by introducing a thin, resistive layer between the bulk material and the emissive coating. The gain and time resolution dependencies on the pore size and voltage are studied numerically. The results are compared with the simulations of other authors and available experimental data.

Original language	English
Title of host publication	IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages	1193-1198
Number of pages	6
DOIs	https://doi.org/10.1109/NSSMIC.2010.5873957
Publication status	Published - Dec 1 2010
Externally published	Yes
Event	2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States Duration: Oct 30 2010 → Nov 6 2010

Publication series

Name	IEEE Nuclear Science Symposium Conference Record
ISSN (Print)	1095-7863

Other

Other	2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country	United States
City	Knoxville, TN
Period	10/30/10 → 11/6/10

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

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Charge relaxation and gain depletion for candidate secondary electron emission materials. / Insepov, Zeke; Ivanov, Valentin; Elam, Jeffrey; Adams, Bernhard; Frisch, H.

IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. p. 1193-1198 5873957 (IEEE Nuclear Science Symposium Conference Record).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Insepov, Z, Ivanov, V, Elam, J, Adams, B & Frisch, H 2010, Charge relaxation and gain depletion for candidate secondary electron emission materials. in IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010., 5873957, IEEE Nuclear Science Symposium Conference Record, pp. 1193-1198, 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010, Knoxville, TN, United States, 10/30/10. https://doi.org/10.1109/NSSMIC.2010.5873957

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abstract = "Microchannel plates (MCPs) are widely used in photodetectors with a picosecond resolution. Two main characteristics of MCPs, gain and timing resolution, strongly depend on the materials parameters, as well as on the history of electron avalanche evolution. The most important effect that can significantly change the efficiency of an MCP is the effect of saturation of the electronic current, which occurs at high-level input signals. In this paper, the saturation effects are studied numerically, as they are applicable to analysis of large-area, fast photodetectors. It is shown that the saturation effect for short pulses can be reduced by introducing a thin, resistive layer between the bulk material and the emissive coating. The gain and time resolution dependencies on the pore size and voltage are studied numerically. The results are compared with the simulations of other authors and available experimental data.",

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