Charge relaxation and gain depletion for candidate secondary electron emission materials

Zeke Insepov, Valentin Ivanov, Jeffrey Elam, Bernhard Adams, H. Frisch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Microchannel plates (MCPs) are widely used in photodetectors with a picosecond resolution. Two main characteristics of MCPs, gain and timing resolution, strongly depend on the materials parameters, as well as on the history of electron avalanche evolution. The most important effect that can significantly change the efficiency of an MCP is the effect of saturation of the electronic current, which occurs at high-level input signals. In this paper, the saturation effects are studied numerically, as they are applicable to analysis of large-area, fast photodetectors. It is shown that the saturation effect for short pulses can be reduced by introducing a thin, resistive layer between the bulk material and the emissive coating. The gain and time resolution dependencies on the pore size and voltage are studied numerically. The results are compared with the simulations of other authors and available experimental data.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages1193-1198
Number of pages6
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: Oct 30 2010Nov 6 2010

Other

Other2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
CountryUnited States
CityKnoxville, TN
Period10/30/1011/6/10

Fingerprint

Avalanches
secondary emission
electron emission
microchannel plates
depletion
History
Electrons
saturation
photometers
electron avalanche
time measurement
histories
porosity
coatings
electric potential
pulses
electronics
simulation

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

Cite this

Insepov, Z., Ivanov, V., Elam, J., Adams, B., & Frisch, H. (2010). Charge relaxation and gain depletion for candidate secondary electron emission materials. In IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010 (pp. 1193-1198). [5873957] https://doi.org/10.1109/NSSMIC.2010.5873957

Charge relaxation and gain depletion for candidate secondary electron emission materials. / Insepov, Zeke; Ivanov, Valentin; Elam, Jeffrey; Adams, Bernhard; Frisch, H.

IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. p. 1193-1198 5873957.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Insepov, Z, Ivanov, V, Elam, J, Adams, B & Frisch, H 2010, Charge relaxation and gain depletion for candidate secondary electron emission materials. in IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010., 5873957, pp. 1193-1198, 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010, Knoxville, TN, United States, 10/30/10. https://doi.org/10.1109/NSSMIC.2010.5873957
Insepov Z, Ivanov V, Elam J, Adams B, Frisch H. Charge relaxation and gain depletion for candidate secondary electron emission materials. In IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. p. 1193-1198. 5873957 https://doi.org/10.1109/NSSMIC.2010.5873957
Insepov, Zeke ; Ivanov, Valentin ; Elam, Jeffrey ; Adams, Bernhard ; Frisch, H. / Charge relaxation and gain depletion for candidate secondary electron emission materials. IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. pp. 1193-1198
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