Chemically assisted ion beam etching of GaAs, Ti, and Mo

J. D. Chinn, A. Fernandez, I. Adesida, E. D. Wolf

Research output: Contribution to journalArticlepeer-review

33 Citations (Scopus)

Abstract

Investigations with argon and chlorinated ion beams have shown that the etch rates of GaAs and Ti are strongly dependent on the flux of molecular and atomic chlorine. Etch rate increases were observed with an increase in the chlorine flux from the background gas composition or from the impinging ion beam. At increased chlorine concentrations in the presence of ion bombardment, wall profiles were altered from an overcut slope to nearly vertical. In the etching of Mo, etch rates were limited by the removal of low volatility chlorides by ion-assisted mechanisms.

Original languageEnglish
Pages (from-to)701-704
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume1
Issue number2
DOIs
Publication statusPublished - Apr 1983

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of 'Chemically assisted ion beam etching of GaAs, Ti, and Mo'. Together they form a unique fingerprint.

Cite this