Comparison of candidate secondary electron emission materials

Z. Insepov, V. Ivanov, H. Frisch

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Secondary electron emission (SEE) yields obtained with empirical models deviate significantly from experiment. Therefore they cannot be used to predict the SEE data for various materials. The angular dependencies of SEE in empirical models are also drastically different and inconvenient for comparison. SEE coefficients were calculated by a theoretical method that uses Monte Carlo simulation, empirical theories, and close comparison to experiment, in order to parameterize the SEE yields of highly emissive materials. We have successfully applied this method to bulk Al2O3, a highly emissive material for micro-channel plates, as well as to thinly deposited films of Al2O3. The simulation results will be used in the selection of an emissive material, and if the emission yield of the material is small, as a resistive material for the deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne National Laboratory.

Original languageEnglish
Pages (from-to)3315-3320
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume268
Issue number20
DOIs
Publication statusPublished - Oct 15 2010
Externally publishedYes

Fingerprint

Electron emission
secondary emission
electron emission
microchannel plates
Experiments
simulation
Detectors
detectors
coefficients

Keywords

  • Materials
  • Micro-channel plate
  • Monte Carlo method
  • Secondary electron emission

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Comparison of candidate secondary electron emission materials. / Insepov, Z.; Ivanov, V.; Frisch, H.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 268, No. 20, 15.10.2010, p. 3315-3320.

Research output: Contribution to journalArticle

@article{fbb0fe9117804b379285098b524f1bb8,
title = "Comparison of candidate secondary electron emission materials",
abstract = "Secondary electron emission (SEE) yields obtained with empirical models deviate significantly from experiment. Therefore they cannot be used to predict the SEE data for various materials. The angular dependencies of SEE in empirical models are also drastically different and inconvenient for comparison. SEE coefficients were calculated by a theoretical method that uses Monte Carlo simulation, empirical theories, and close comparison to experiment, in order to parameterize the SEE yields of highly emissive materials. We have successfully applied this method to bulk Al2O3, a highly emissive material for micro-channel plates, as well as to thinly deposited films of Al2O3. The simulation results will be used in the selection of an emissive material, and if the emission yield of the material is small, as a resistive material for the deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne National Laboratory.",
keywords = "Materials, Micro-channel plate, Monte Carlo method, Secondary electron emission",
author = "Z. Insepov and V. Ivanov and H. Frisch",
year = "2010",
month = "10",
day = "15",
doi = "10.1016/j.nimb.2010.08.002",
language = "English",
volume = "268",
pages = "3315--3320",
journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",
issn = "0168-583X",
publisher = "Elsevier",
number = "20",

}

TY - JOUR

T1 - Comparison of candidate secondary electron emission materials

AU - Insepov, Z.

AU - Ivanov, V.

AU - Frisch, H.

PY - 2010/10/15

Y1 - 2010/10/15

N2 - Secondary electron emission (SEE) yields obtained with empirical models deviate significantly from experiment. Therefore they cannot be used to predict the SEE data for various materials. The angular dependencies of SEE in empirical models are also drastically different and inconvenient for comparison. SEE coefficients were calculated by a theoretical method that uses Monte Carlo simulation, empirical theories, and close comparison to experiment, in order to parameterize the SEE yields of highly emissive materials. We have successfully applied this method to bulk Al2O3, a highly emissive material for micro-channel plates, as well as to thinly deposited films of Al2O3. The simulation results will be used in the selection of an emissive material, and if the emission yield of the material is small, as a resistive material for the deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne National Laboratory.

AB - Secondary electron emission (SEE) yields obtained with empirical models deviate significantly from experiment. Therefore they cannot be used to predict the SEE data for various materials. The angular dependencies of SEE in empirical models are also drastically different and inconvenient for comparison. SEE coefficients were calculated by a theoretical method that uses Monte Carlo simulation, empirical theories, and close comparison to experiment, in order to parameterize the SEE yields of highly emissive materials. We have successfully applied this method to bulk Al2O3, a highly emissive material for micro-channel plates, as well as to thinly deposited films of Al2O3. The simulation results will be used in the selection of an emissive material, and if the emission yield of the material is small, as a resistive material for the deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne National Laboratory.

KW - Materials

KW - Micro-channel plate

KW - Monte Carlo method

KW - Secondary electron emission

UR - http://www.scopus.com/inward/record.url?scp=77956394723&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77956394723&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2010.08.002

DO - 10.1016/j.nimb.2010.08.002

M3 - Article

VL - 268

SP - 3315

EP - 3320

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 20

ER -