Coverage probability analysis by fractional frequency reuse scheme

Joydev Ghosh, Dushanta Nalin K. Jayakody, Marwa Qaraqe, Theodoros A. Tsiftsis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this work, we present the cell edge coverage probability (CECP) performance of cellular networks under the composite multi-path fading environment, where Rayleigh fading is superimposed on log-normal shadowing, by the fractional frequency reuse (FFR) scheme. We demonstrate that our analytical results and the simulation results are in line with the analysis presented in Novlan et al. (IEEE Trans Wirel Commun 10(12):4294–4305, 2011, [12]). In addition, we highlight that the superiority of the proposed analytical results over Novlan et al. (IEEE Trans Wirel Commun 10(12):4294–4305, 2011, [12]) in relation to the computational complexity.

Original languageEnglish
Title of host publicationInternational Telecommunications Conference - Proceedings of the ITelCon 2017
EditorsAli Boyaci, Ali Riza Ekti, Muhammed Ali Aydin, Serhan Yarkan
PublisherSpringer Verlag
Pages31-39
Number of pages9
ISBN (Print)9789811304071
DOIs
Publication statusPublished - Jan 1 2019
Event1st International Telecommunications Conference, ITelCon 2017 - İstanbul, Turkey
Duration: Dec 28 2017Dec 29 2017

Publication series

NameLecture Notes in Electrical Engineering
Volume504
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

Conference1st International Telecommunications Conference, ITelCon 2017
CountryTurkey
Cityİstanbul
Period12/28/1712/29/17

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Keywords

  • Cell Edge Coverage Probability (CECP)
  • Composite multi-path fading
  • Fractional Frequency Reuse (FFR) Scheme

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

Cite this

Ghosh, J., Jayakody, D. N. K., Qaraqe, M., & Tsiftsis, T. A. (2019). Coverage probability analysis by fractional frequency reuse scheme. In A. Boyaci, A. R. Ekti, M. A. Aydin, & S. Yarkan (Eds.), International Telecommunications Conference - Proceedings of the ITelCon 2017 (pp. 31-39). (Lecture Notes in Electrical Engineering; Vol. 504). Springer Verlag. https://doi.org/10.1007/978-981-13-0408-8_3