Abstract
In the present work, the effect of indium (In) doping on the various properties of the zinc oxide (ZnO) thin films was investigated. The pure and 5% In doped ZnO thin films have been synthesized via the successive ionic layer adsorption and reaction (SILAR) method on glass substrates. The X-Ray Diffraction (XRD) analysis clearly indicated the well-crystalline wurtzite structure of ZnO and 5% In-ZnO films. The Scanning Electron Microscopy (SEM) study depicted the formation of granular and nanoflower structures on the surface of the synthesized films. The band-gap energy and the grain size values of 5% In-ZnO were found to be 3.32 eV and 22.33 nm, respectively. Also, the indium incorporation into ZnO made a significant change on the structural, morphological properties, and enhanced the gas-sensing performance of ZnO host material.
| Original language | English |
|---|---|
| Pages (from-to) | 2495-2500 |
| Number of pages | 6 |
| Journal | Materials Today: Proceedings |
| Volume | 49 |
| DOIs | |
| Publication status | Published - 2021 |
| Event | 8th International Conference on Nanomaterials and Advanced Energy Storage Systems, INESS 2020 - Uttar Pradesh, India Duration: Aug 6 2020 → Aug 6 2020 |
Funding
This research was supported by the research grant (CRP) 021220CRP0122 “Development of highly sensitive MOS based nano-film gas sensors” from Nazarbayev University.
Keywords
- Gas sensor
- In doped ZnO
- NO
- SILAR
ASJC Scopus subject areas
- General Materials Science
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