Failure prediction of normally consolidated clays using stress paths of consolidated undrained tests

Jong R. Kim, Galym Zhumabekov, Dias Bakhtiyarov, Dilmurat Saliyev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new method of stability evaluation of the stage-constructed embankment on soft ground using stress path is developed and presented in this paper. A series of CU tests was carried out to develop the new method to evaluate the stability of soft ground. A new concept of stability index (SI) is defined with stress path. The effective stress path (ESP) line approaches to the Kf line gradually along the same direction to a certain point, then the direction changes and approaches to the Kf line rapidly. The potential of failure increases swiftly when SI is less than 0.4, and the value of SI=0.4 could be assumed as a representative value to evaluate the potential of failure for the tested material.

Original languageEnglish
Title of host publicationKey Engineering Materials - Development and Application
PublisherTrans Tech Publications
Pages499-503
Number of pages5
ISBN (Print)9783038350668
DOIs
Publication statusPublished - Jan 1 2014
Event4th International Conference on Key Engineering Materials, ICKEM 2014 - Bali, Indonesia
Duration: Mar 22 2014Mar 23 2014

Publication series

NameAdvanced Materials Research
Volume911
ISSN (Print)1022-6680

Other

Other4th International Conference on Key Engineering Materials, ICKEM 2014
CountryIndonesia
CityBali
Period3/22/143/23/14

Keywords

  • CU test
  • Embankment on soft ground
  • Potential of failure
  • Stability evaluation
  • Stability index (SI)
  • Stress path

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Kim, J. R., Zhumabekov, G., Bakhtiyarov, D., & Saliyev, D. (2014). Failure prediction of normally consolidated clays using stress paths of consolidated undrained tests. In Key Engineering Materials - Development and Application (pp. 499-503). (Advanced Materials Research; Vol. 911). Trans Tech Publications. https://doi.org/10.4028/www.scientific.net/AMR.911.499