Far field imaging of a dielectric inclusion

Abdul Wahab, Naveed Ahmed, Tasawar Abbas

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

Original languageEnglish
Article number012001
JournalJournal of Physics: Conference Series
Volume657
Issue number1
DOIs
Publication statusPublished - Nov 16 2015
Event5th International Workshop on New Computational Methods for Inverse Problems, NCMIP 2015 - Cachan, France
Duration: May 29 2015 → …

ASJC Scopus subject areas

  • General Physics and Astronomy

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