Far field imaging of a dielectric inclusion

Abdul Wahab; Naveed Ahmed; Tasawar Abbas

doi:10.1088/1742-6596/657/1/012001

Far field imaging of a dielectric inclusion

Abdul Wahab
, Naveed Ahmed
, Tasawar Abbas

Department of Mathematics

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

Original language	English
Article number	012001
Journal	Journal of Physics: Conference Series
Volume	657
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/657/1/012001
Publication status	Published - Nov 16 2015
Event	5th International Workshop on New Computational Methods for Inverse Problems, NCMIP 2015 - Cachan, France Duration: May 29 2015 → …

ASJC Scopus subject areas

General Physics and Astronomy

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10.1088/1742-6596/657/1/012001

Cite this

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title = "Far field imaging of a dielectric inclusion",

abstract = "A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.",

author = "Abdul Wahab and Naveed Ahmed and Tasawar Abbas",

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AU - Wahab, Abdul

AU - Ahmed, Naveed

AU - Abbas, Tasawar

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PY - 2015/11/16

Y1 - 2015/11/16

N2 - A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

AB - A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

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U2 - 10.1088/1742-6596/657/1/012001

DO - 10.1088/1742-6596/657/1/012001

M3 - Conference article

AN - SCOPUS:84953308659

SN - 1742-6588

VL - 657

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

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M1 - 012001

T2 - 5th International Workshop on New Computational Methods for Inverse Problems, NCMIP 2015

Y2 - 29 May 2015

ER -

Far field imaging of a dielectric inclusion

Abstract

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