Few-Shot Learning based on Residual Neural Networks for X-ray Image Classification

Rakhat Abdrakhmanov, Dmitriy Viderman, Kok Seng Wong, Minho Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Currently, deep learning is widely used in the field of medicine, which in turn includes radiology. This paper considers the problem of the classification of X-ray images and the lack of images of specific classes. The classes included COVID-19 and Normal X-ray scans. To solve the problems, we propose few-shot learning that is based on different Residual Convolutional Neural Network models with different complexities. The method is designed for the datasets that have small amount of samples of a specific class and a larger amount of instances of another class. The utilization of few-shot learning can solve the issues of the balance of X-ray datasets. The Residual Convolutional Neural Network models we used are as follows: ResNet-50, ResNet-101, and ResNet-152. The architectures had been used to extract the features from the images that were used later. The latter model has the highest complexity, while the former has the lowest complexity, respectively. The obtained results include the highest accuracy of 97.7% for 10 shots of COVID-19 positive X-ray images. The accuracy was achieved using ResNet-101 model. The highest result for ResNet-152 model was 95.6 %. However, on average, the model achieved the highest accuracy. ResNet-50 model provided the least accurate results, however, it is less complex which provides faster performance. One can also notice that with the higher number of COVID-19 positive shots that were used for training, the accuracy also gets higher. To provide transparency to our solution, we furthermore created t-distributed stochastic neighbor embedding visualization. This showed us that the system could separate the two classes into two distinct clusters. Overall, the results imply the efficiency of the solution that was proposed in the study.

Original languageEnglish
Title of host publication2022 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2022 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1817-1821
Number of pages5
ISBN (Electronic)9781665452588
DOIs
Publication statusPublished - 2022
Event2022 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2022 - Prague, Czech Republic
Duration: Oct 9 2022Oct 12 2022

Publication series

NameConference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
Volume2022-October
ISSN (Print)1062-922X

Conference

Conference2022 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2022
Country/TerritoryCzech Republic
CityPrague
Period10/9/2210/12/22

Keywords

  • Computer Vision
  • COVID-19
  • Deep Learning
  • Few-Shot Learning
  • X-ray

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Human-Computer Interaction

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