Flicker noise in YBa2Cu3O7-δ bicrystal grain boundary junctions in weak magnetic fields

Charles Surya, N. E. Israeloff, A. Widom, R. Seed, C. Vittoria

Research output: Contribution to journalArticle

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Abstract

Flicker noise in c-axis oriented long YBCO bicrystal grain boundary junctions was characterized as a function of temperature, biasing conditions, and magnetic field applied perpendicular to the a-b plane over a wide range of temperatures from 15 K to over 70 K. Aperiodic variations, as a function of magnetic field, were observed in both the junction voltages, VJ, and the flicker noise magnitude under constant current bias as the magnetic field was scanned from 0 to 8 G. The noise magnitudes were found to peak at the minima of VJ. Analyses of the field dependencies of the magnitudes and the functional form of the voltage noise power spectra show that the noise did not arise from thermally activated flux motion. Based on the dependencies of the noise power spectra on the bias current and the dynamic resistance of the junction, we conclude that the noise originates from the fluctuations of the critical current of the devices most likely due to trapping of carriers or defect motion within the grain boundary.

Original languageEnglish
Number of pages1
JournalApplied Physics Letters
Volume67
DOIs
Publication statusPublished - Dec 1 1995
Externally publishedYes

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flicker
bicrystals
grain boundaries
magnetic fields
noise spectra
power spectra
electric potential
critical current
trapping
temperature
defects

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Flicker noise in YBa2Cu3O7-δ bicrystal grain boundary junctions in weak magnetic fields. / Surya, Charles; Israeloff, N. E.; Widom, A.; Seed, R.; Vittoria, C.

In: Applied Physics Letters, Vol. 67, 01.12.1995.

Research output: Contribution to journalArticle

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