High-frequency optical fiber microphone for condition-based maintenance application

Daniele Tosi, Massimo Olivero, Guido Perrone, Alberto Vallan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A low-cost optical fiber Bragg grating-based microphone is presented. The sensing system makes use of an intensitybased interrogation approach, with a fixed-wavelength laser source employed as optical source. The optical sensor is complemented by signal processing, consisting of adaptive filters and a Capon power spectral density estimator. System characterization has been carried out, showing maximum sensitivity in the 120-450 Hz range, with 0.45 Hz repeatability on single-tone detection. Application for condition-based maintenance of industrial plants, based on a simulated model, is discussed.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection VIII
DOIs
Publication statusPublished - Aug 1 2013
EventOptical Measurement Systems for Industrial Inspection VIII - Munich, Germany
Duration: May 13 2013May 16 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8788
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical Measurement Systems for Industrial Inspection VIII
CountryGermany
CityMunich
Period5/13/135/16/13

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Keywords

  • Acoustic optical transducer
  • Condition based maintenance (CBM)
  • FBG sensor
  • Fiber Bragg grating (FBG)
  • Fiber optic sensors (FOS)
  • Frequency spectrum estimation
  • Optical microphone

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Tosi, D., Olivero, M., Perrone, G., & Vallan, A. (2013). High-frequency optical fiber microphone for condition-based maintenance application. In Optical Measurement Systems for Industrial Inspection VIII [87880Z] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8788). https://doi.org/10.1117/12.2019249