TY - GEN
T1 - High-frequency optical fiber microphone for condition-based maintenance application
AU - Tosi, Daniele
AU - Olivero, Massimo
AU - Perrone, Guido
AU - Vallan, Alberto
PY - 2013/8/1
Y1 - 2013/8/1
N2 - A low-cost optical fiber Bragg grating-based microphone is presented. The sensing system makes use of an intensitybased interrogation approach, with a fixed-wavelength laser source employed as optical source. The optical sensor is complemented by signal processing, consisting of adaptive filters and a Capon power spectral density estimator. System characterization has been carried out, showing maximum sensitivity in the 120-450 Hz range, with 0.45 Hz repeatability on single-tone detection. Application for condition-based maintenance of industrial plants, based on a simulated model, is discussed.
AB - A low-cost optical fiber Bragg grating-based microphone is presented. The sensing system makes use of an intensitybased interrogation approach, with a fixed-wavelength laser source employed as optical source. The optical sensor is complemented by signal processing, consisting of adaptive filters and a Capon power spectral density estimator. System characterization has been carried out, showing maximum sensitivity in the 120-450 Hz range, with 0.45 Hz repeatability on single-tone detection. Application for condition-based maintenance of industrial plants, based on a simulated model, is discussed.
KW - Acoustic optical transducer
KW - Condition based maintenance (CBM)
KW - FBG sensor
KW - Fiber Bragg grating (FBG)
KW - Fiber optic sensors (FOS)
KW - Frequency spectrum estimation
KW - Optical microphone
UR - http://www.scopus.com/inward/record.url?scp=84880705848&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84880705848&partnerID=8YFLogxK
U2 - 10.1117/12.2019249
DO - 10.1117/12.2019249
M3 - Conference contribution
AN - SCOPUS:84880705848
SN - 9780819496041
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Measurement Systems for Industrial Inspection VIII
T2 - Optical Measurement Systems for Industrial Inspection VIII
Y2 - 13 May 2013 through 16 May 2013
ER -