TY - GEN
T1 - Impedance spectroscopy of semiconductor heterojunctions
AU - Brus, V. V.
PY - 2012
Y1 - 2012
N2 - The quantitative analysis of the impedance of nonideal heterojunctions was carried out taking into consideration the effects of series resistance, shunt resistance, parasitic inductance and electrically active interface traps. A new approach is proposed to determine the energy distribution of surface state density and to calculate the actual value of barrier capacitance of heterojunctions on the basis of the analysis of their complex impedance-voltage characteristics.
AB - The quantitative analysis of the impedance of nonideal heterojunctions was carried out taking into consideration the effects of series resistance, shunt resistance, parasitic inductance and electrically active interface traps. A new approach is proposed to determine the energy distribution of surface state density and to calculate the actual value of barrier capacitance of heterojunctions on the basis of the analysis of their complex impedance-voltage characteristics.
UR - http://www.scopus.com/inward/record.url?scp=84869849091&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84869849091&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84869849091
SN - 9789663353760
T3 - CriMiCo 2012 - 2012 22nd International Crimean Conference Microwave and Telecommunication Technology, Conference Proceedings
SP - 145
EP - 146
BT - CriMiCo 2012 - 2012 22nd International Crimean Conference Microwave and Telecommunication Technology, Conference Proceedings
T2 - 2012 22nd International Crimean Conference Microwave and Telecommunication Technology, CriMiCo 2012
Y2 - 10 September 2012 through 14 September 2012
ER -