In situ laser-based resonant ultrasound measurements of microstructure mediated mechanical property evolution

D. H. Hurley, S. J. Reese, S. K. Park, Z. Utegulov, J. R. Kennedy, K. L. Telschow

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

In situ laser-based resonant ultrasound spectroscopy is used to characterize the development of a recrystallized microstructure in a high purity copper sample. The modal shapes, used for mode identification, of several resonant modes are determined before and after annealing by raster scanning the laser interferometric probe. This information is used to isolate the motion of individual modes during high temperature annealing. The evolution of a particular mode during annealing is examined in detail. During recrystallization, the center frequency of this mode shifts by approximately 20% of the original value. Using electron backscatter data it is shown that the majority of this shift is due to changes in the polycrystal average elastic stiffness tensor, driven by changes in texture, and that changes in dislocation density and pinning length are secondary influences.

Original languageEnglish
Article number063510
JournalJournal of Applied Physics
Volume107
Issue number6
DOIs
Publication statusPublished - 2010
Externally publishedYes

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mechanical properties
microstructure
lasers
annealing
raster scanning
shift
polycrystals
stiffness
purity
textures
tensors
copper
probes
spectroscopy
electrons

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

In situ laser-based resonant ultrasound measurements of microstructure mediated mechanical property evolution. / Hurley, D. H.; Reese, S. J.; Park, S. K.; Utegulov, Z.; Kennedy, J. R.; Telschow, K. L.

In: Journal of Applied Physics, Vol. 107, No. 6, 063510, 2010.

Research output: Contribution to journalArticle

Hurley, D. H. ; Reese, S. J. ; Park, S. K. ; Utegulov, Z. ; Kennedy, J. R. ; Telschow, K. L. / In situ laser-based resonant ultrasound measurements of microstructure mediated mechanical property evolution. In: Journal of Applied Physics. 2010 ; Vol. 107, No. 6.
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