Abstract
Results of investigations of kinetic properties of TiN thin films prepared by dc reactive magnetron sputtering are presented. It is established that the TiN thin films are polycrystalline and possess semiconductor n-type conduction. The carrier concentration is ∼1022 cm-3, while electron scattering occurs at ionized titanium atoms.
Original language | English |
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Pages (from-to) | 2234-2238 |
Number of pages | 5 |
Journal | Physics of the Solid State |
Volume | 55 |
Issue number | 11 |
DOIs | |
Publication status | Published - Nov 2013 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics