Low-frequency noise characterization of hot-electron degradation in GaN-based HEMTs

S. Jha, J. Gao, C. F. Zhu, E. Jelenkovic, K. Y. Tong, M. Pilkuhn, C. Surya, H. Schweizer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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Physics & Astronomy