Mid-IR random lasing effect induced by increased impact of disorder in a planar slab

Carlo Molardi, Houkun K. Liang, Xia Yu, Annamaria Cucinotta, Stefano Selleri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Random lasing in 2D structures, obtained in QCL substrates carved with random patterns of holes, has been numerically analyzed. Results show the dependency on scattering induced by holes Filling Factor. A Monte Carlo based software has been implemented to investigate the photons travel distance statistics.

Original languageEnglish
Title of host publication2016 IEEE Photonics Conference, IPC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages78-79
Number of pages2
ISBN (Electronic)9781509019069
DOIs
Publication statusPublished - Jan 23 2017
Externally publishedYes
Event29th IEEE Photonics Conference, IPC 2016 - Waikoloa, United States
Duration: Oct 2 2016Oct 6 2016

Conference

Conference29th IEEE Photonics Conference, IPC 2016
CountryUnited States
CityWaikoloa
Period10/2/1610/6/16

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Mid-IR random lasing effect induced by increased impact of disorder in a planar slab'. Together they form a unique fingerprint.

  • Cite this

    Molardi, C., Liang, H. K., Yu, X., Cucinotta, A., & Selleri, S. (2017). Mid-IR random lasing effect induced by increased impact of disorder in a planar slab. In 2016 IEEE Photonics Conference, IPC 2016 (pp. 78-79). [7830987] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IPCon.2016.7830987