Miniature low-cost extrinsic Fabry-Perot interferometer for lowpressure detection

Sven Poeggel, Daniele Tosi, Gabriel Leen, Elfed Lewis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A miniature optical fiber pressure sensor based on extrinsic Fabry-Perot interferometer (EFPI) is presented. The sensing probe has 0.2 mm outer diameter, and is based on an all-silica biocompatible structure, with a pressure sensitivity <1 nm/kPa. The probe is complemented by a fiber Bragg grating (FBG), in proximity of the EFPI tip, for temperature compensation. Interrogation is based on a low-cost white-light setup, whereas several pressure detection algorithms have been developed. Preliminary experimental validation and medical applications are discussed.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection VIII
DOIs
Publication statusPublished - Aug 1 2013
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection VIII - Munich, Germany
Duration: May 13 2013May 16 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8788
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical Measurement Systems for Industrial Inspection VIII
CountryGermany
CityMunich
Period5/13/135/16/13

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Keywords

  • Extrinsic Fabry-Perot Interferometer (EFPI)
  • Fabry-Perot interferometry (FPI)
  • Fiber optic pressure sensor (FOPS)
  • Fiber optic sensor (FOS)
  • Medical pressure sensor
  • Pressure transducer

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Poeggel, S., Tosi, D., Leen, G., & Lewis, E. (2013). Miniature low-cost extrinsic Fabry-Perot interferometer for lowpressure detection. In Optical Measurement Systems for Industrial Inspection VIII [878811] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8788). https://doi.org/10.1117/12.2019799