Modes analysis in random structures varying the disorder magnitude

Carlo Molardi; Houkun Liang; Xia Yu; Ying Zhang; Annamaria Cucinotta; Stefano Selleri

doi:10.1117/12.2078133

Modes analysis in random structures varying the disorder magnitude

Carlo Molardi, Houkun Liang, Xia Yu, Ying Zhang, Annamaria Cucinotta, Stefano Selleri

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Modal properties of disordered optical structures, including a 1D-like multilayer structure and a 2D planar slab, have been numerically simulated in the Mid-IR region. The amount of scattering and the disorder level have been varied. A Finite Element Method solver has been used to show the modal properties of these structures, highlighting the correlation between the spectral behavior and the amount of disorder. The quality factor has also been investigated. A statistical parameter, based on the definition of photons travel distance, has been proposed to give a measure of the disorder according to the modal properties. With the help of a Monte Carlo based software this parameter has been investigated to verify its suitability.

Original language	English
Title of host publication	Physics and Simulation of Optoelectronic Devices XXIII
Editors	Bernd Witzigmann, Yasuhiko Arakawa, Fritz Henneberger, Marek Osinski
Publisher	SPIE
Volume	9357
ISBN (Electronic)	9781628414479
DOIs	https://doi.org/10.1117/12.2078133
Publication status	Published - Jan 1 2015
Externally published	Yes
Event	23rd SPIE Conference on Physics and Simulation of Optoelectronic Devices - San Francisco, United States Duration: Feb 9 2015 → Feb 12 2015

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9357
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	23rd SPIE Conference on Physics and Simulation of Optoelectronic Devices
Country	United States
City	San Francisco
Period	2/9/15 → 2/12/15

Keywords

Disordered structures
Middle infrared
Quality factor
Random lasers

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2078133

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Cite this

Molardi, C., Liang, H., Yu, X., Zhang, Y., Cucinotta, A., & Selleri, S. (2015). Modes analysis in random structures varying the disorder magnitude. In B. Witzigmann, Y. Arakawa, F. Henneberger, & M. Osinski (Eds.), Physics and Simulation of Optoelectronic Devices XXIII (Vol. 9357). [935713] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9357). SPIE. https://doi.org/10.1117/12.2078133

Modes analysis in random structures varying the disorder magnitude. / Molardi, Carlo; Liang, Houkun; Yu, Xia; Zhang, Ying; Cucinotta, Annamaria; Selleri, Stefano.

Physics and Simulation of Optoelectronic Devices XXIII. ed. / Bernd Witzigmann; Yasuhiko Arakawa; Fritz Henneberger; Marek Osinski. Vol. 9357 SPIE, 2015. 935713 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9357).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Molardi, C, Liang, H, Yu, X, Zhang, Y, Cucinotta, A & Selleri, S 2015, Modes analysis in random structures varying the disorder magnitude. in B Witzigmann, Y Arakawa, F Henneberger & M Osinski (eds), Physics and Simulation of Optoelectronic Devices XXIII. vol. 9357, 935713, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9357, SPIE, 23rd SPIE Conference on Physics and Simulation of Optoelectronic Devices, San Francisco, United States, 2/9/15. https://doi.org/10.1117/12.2078133

Molardi C, Liang H, Yu X, Zhang Y, Cucinotta A, Selleri S. Modes analysis in random structures varying the disorder magnitude. In Witzigmann B, Arakawa Y, Henneberger F, Osinski M, editors, Physics and Simulation of Optoelectronic Devices XXIII. Vol. 9357. SPIE. 2015. 935713. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2078133

Molardi, Carlo ; Liang, Houkun ; Yu, Xia ; Zhang, Ying ; Cucinotta, Annamaria ; Selleri, Stefano. / Modes analysis in random structures varying the disorder magnitude. Physics and Simulation of Optoelectronic Devices XXIII. editor / Bernd Witzigmann ; Yasuhiko Arakawa ; Fritz Henneberger ; Marek Osinski. Vol. 9357 SPIE, 2015. (Proceedings of SPIE - The International Society for Optical Engineering).

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