Molecular dynamics simulation of fullerene cluster ion impact

Takaaki Aoki, Toshio Seki, Masahiro Tanomura, Jiro Matsuo, Zinetulla Insepov, Isao Yamada

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

In order to interpret the projection range and to reveal the mechanism of damage formation by cluster ion impact, molecular dynamics simulations of a fullerene carbon cluster (C60) impacting on diamond (001) surfaces were performed. When the kinetic energy of C60 is as low as 200 eV/atom, C60 implants into the substrate deeper than a monomer ion with the same energy per atom because of the clearing-way effect. The kinetic energy of the cluster disperses isotropically because of the multiple-collision effect, and then a large hemispherical damage region is formed. When the energy of the cluster is as high as 2 keV/atom, the cluster dissociates in the substrate, and then cascade damage is formed like in a case of a monomer ion impact. The projection range of incident atoms becomes similar to that of the monomer with the same energy per atom. However, the number of displacements of C60 is larger than the summation of 60 monomer carbons. The displacement yield of fullerene is 4 to 7 times higher than that of monomer carbon. This result agrees with the measurement of the displacements made on sapphire substrates with C60 and C2 irradiation.

Original languageEnglish
Pages (from-to)81-86
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume504
Publication statusPublished - 1999
Externally publishedYes

Fingerprint

Fullerenes
ion impact
fullerenes
Molecular dynamics
monomers
Monomers
Ions
molecular dynamics
Atoms
Computer simulation
atoms
damage
simulation
Kinetic energy
carbon
Substrates
Carbon
kinetic energy
projection
Carbon clusters

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Aoki, T., Seki, T., Tanomura, M., Matsuo, J., Insepov, Z., & Yamada, I. (1999). Molecular dynamics simulation of fullerene cluster ion impact. Materials Research Society Symposium - Proceedings, 504, 81-86.

Molecular dynamics simulation of fullerene cluster ion impact. / Aoki, Takaaki; Seki, Toshio; Tanomura, Masahiro; Matsuo, Jiro; Insepov, Zinetulla; Yamada, Isao.

In: Materials Research Society Symposium - Proceedings, Vol. 504, 1999, p. 81-86.

Research output: Contribution to journalArticle

Aoki, T, Seki, T, Tanomura, M, Matsuo, J, Insepov, Z & Yamada, I 1999, 'Molecular dynamics simulation of fullerene cluster ion impact', Materials Research Society Symposium - Proceedings, vol. 504, pp. 81-86.
Aoki, Takaaki ; Seki, Toshio ; Tanomura, Masahiro ; Matsuo, Jiro ; Insepov, Zinetulla ; Yamada, Isao. / Molecular dynamics simulation of fullerene cluster ion impact. In: Materials Research Society Symposium - Proceedings. 1999 ; Vol. 504. pp. 81-86.
@article{13dceaae103147ccbae0cc5d037ea592,
title = "Molecular dynamics simulation of fullerene cluster ion impact",
abstract = "In order to interpret the projection range and to reveal the mechanism of damage formation by cluster ion impact, molecular dynamics simulations of a fullerene carbon cluster (C60) impacting on diamond (001) surfaces were performed. When the kinetic energy of C60 is as low as 200 eV/atom, C60 implants into the substrate deeper than a monomer ion with the same energy per atom because of the clearing-way effect. The kinetic energy of the cluster disperses isotropically because of the multiple-collision effect, and then a large hemispherical damage region is formed. When the energy of the cluster is as high as 2 keV/atom, the cluster dissociates in the substrate, and then cascade damage is formed like in a case of a monomer ion impact. The projection range of incident atoms becomes similar to that of the monomer with the same energy per atom. However, the number of displacements of C60 is larger than the summation of 60 monomer carbons. The displacement yield of fullerene is 4 to 7 times higher than that of monomer carbon. This result agrees with the measurement of the displacements made on sapphire substrates with C60 and C2 irradiation.",
author = "Takaaki Aoki and Toshio Seki and Masahiro Tanomura and Jiro Matsuo and Zinetulla Insepov and Isao Yamada",
year = "1999",
language = "English",
volume = "504",
pages = "81--86",
journal = "Materials Research Society Symposium - Proceedings",
issn = "0272-9172",
publisher = "Materials Research Society",

}

TY - JOUR

T1 - Molecular dynamics simulation of fullerene cluster ion impact

AU - Aoki, Takaaki

AU - Seki, Toshio

AU - Tanomura, Masahiro

AU - Matsuo, Jiro

AU - Insepov, Zinetulla

AU - Yamada, Isao

PY - 1999

Y1 - 1999

N2 - In order to interpret the projection range and to reveal the mechanism of damage formation by cluster ion impact, molecular dynamics simulations of a fullerene carbon cluster (C60) impacting on diamond (001) surfaces were performed. When the kinetic energy of C60 is as low as 200 eV/atom, C60 implants into the substrate deeper than a monomer ion with the same energy per atom because of the clearing-way effect. The kinetic energy of the cluster disperses isotropically because of the multiple-collision effect, and then a large hemispherical damage region is formed. When the energy of the cluster is as high as 2 keV/atom, the cluster dissociates in the substrate, and then cascade damage is formed like in a case of a monomer ion impact. The projection range of incident atoms becomes similar to that of the monomer with the same energy per atom. However, the number of displacements of C60 is larger than the summation of 60 monomer carbons. The displacement yield of fullerene is 4 to 7 times higher than that of monomer carbon. This result agrees with the measurement of the displacements made on sapphire substrates with C60 and C2 irradiation.

AB - In order to interpret the projection range and to reveal the mechanism of damage formation by cluster ion impact, molecular dynamics simulations of a fullerene carbon cluster (C60) impacting on diamond (001) surfaces were performed. When the kinetic energy of C60 is as low as 200 eV/atom, C60 implants into the substrate deeper than a monomer ion with the same energy per atom because of the clearing-way effect. The kinetic energy of the cluster disperses isotropically because of the multiple-collision effect, and then a large hemispherical damage region is formed. When the energy of the cluster is as high as 2 keV/atom, the cluster dissociates in the substrate, and then cascade damage is formed like in a case of a monomer ion impact. The projection range of incident atoms becomes similar to that of the monomer with the same energy per atom. However, the number of displacements of C60 is larger than the summation of 60 monomer carbons. The displacement yield of fullerene is 4 to 7 times higher than that of monomer carbon. This result agrees with the measurement of the displacements made on sapphire substrates with C60 and C2 irradiation.

UR - http://www.scopus.com/inward/record.url?scp=0032651406&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032651406&partnerID=8YFLogxK

M3 - Article

VL - 504

SP - 81

EP - 86

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

SN - 0272-9172

ER -