Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

A. Alexeev, J. Loos, M. M. Koetse

Research output: Contribution to journalArticlepeer-review

95 Citations (Scopus)

Abstract

For the first time local electrical characteristics of a blend of two semiconducting polymers were studied with conductive atomic force microscopy (C-AFM). The investigated mixture is potentially interesting as the active layer in plastic photovoltaic devices. Besides conventional topography analysis of morphology and phase separation, the internal structure of the active layer was investigated by observing the current distribution with nanoscale spatial resolution. Similar to force spectroscopy, current imaging spectroscopy was performed during scanning the sample surface. Different types of current-voltage (I-V) characteristics were extracted from the array of spectroscopic data obtained from each point of the scans, and local heterogeneities of the electric characteristic were determined and discussed.

Original languageEnglish
Pages (from-to)191-199
Number of pages9
JournalUltramicroscopy
Volume106
Issue number3
DOIs
Publication statusPublished - Feb 1 2006

Keywords

  • Conductive atomic force microscopy
  • Current imaging spectroscopy
  • Semiconducting polymer blend

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Fingerprint Dive into the research topics of 'Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)'. Together they form a unique fingerprint.

Cite this