Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

A. Alexeev, J. Loos, M. M. Koetse

Research output: Contribution to journalArticle

89 Citations (Scopus)

Abstract

For the first time local electrical characteristics of a blend of two semiconducting polymers were studied with conductive atomic force microscopy (C-AFM). The investigated mixture is potentially interesting as the active layer in plastic photovoltaic devices. Besides conventional topography analysis of morphology and phase separation, the internal structure of the active layer was investigated by observing the current distribution with nanoscale spatial resolution. Similar to force spectroscopy, current imaging spectroscopy was performed during scanning the sample surface. Different types of current-voltage (I-V) characteristics were extracted from the array of spectroscopic data obtained from each point of the scans, and local heterogeneities of the electric characteristic were determined and discussed.

Original languageEnglish
Pages (from-to)191-199
Number of pages9
JournalUltramicroscopy
Volume106
Issue number3
DOIs
Publication statusPublished - Feb 2006
Externally publishedYes

Fingerprint

Semiconducting polymers
polymer blends
Polymer blends
Atomic force microscopy
atomic force microscopy
Spectroscopy
Phase separation
Topography
current distribution
Plastics
Scanning
Imaging techniques
spectroscopy
topography
Electric potential
plastics
spatial resolution
scanning
polymers
electric potential

Keywords

  • Conductive atomic force microscopy
  • Current imaging spectroscopy
  • Semiconducting polymer blend

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM). / Alexeev, A.; Loos, J.; Koetse, M. M.

In: Ultramicroscopy, Vol. 106, No. 3, 02.2006, p. 191-199.

Research output: Contribution to journalArticle

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