On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm

Omer Gokalp Memis, Alex Katsnelson, Hooman Mohseni, Minjun Yan, Shuang Zhang, Tim Hossain, Niu Jin, Ilesanmi Adesida

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The transient response of a nanoinjection infrared photon detector was studied by exploring the relation between lateral charge transfer and jitter. The jitter of the device was measured to be 15 ps at room temperature. The jitter was almost independent of the pulse power, even after device saturation. Spatial maps for delay and amplitude were acquired. The carrier velocity was extracted from the measurements and compared with that of the simulation model. The jitter due to transit time was calculated to be in agreement with the measured data, which indicated that the jitter is primarily transit time limited.

Original languageEnglish
Pages (from-to)867-869
Number of pages3
JournalIEEE Electron Device Letters
Volume29
Issue number8
DOIs
Publication statusPublished - Aug 2008
Externally publishedYes

Fingerprint

Jitter
Photons
Detectors
Temperature
Transient analysis
Charge transfer
Infrared radiation

Keywords

  • Jitter
  • Lateral transport
  • Nanoinjection
  • Photon detector

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm. / Memis, Omer Gokalp; Katsnelson, Alex; Mohseni, Hooman; Yan, Minjun; Zhang, Shuang; Hossain, Tim; Jin, Niu; Adesida, Ilesanmi.

In: IEEE Electron Device Letters, Vol. 29, No. 8, 08.2008, p. 867-869.

Research output: Contribution to journalArticle

Memis, OG, Katsnelson, A, Mohseni, H, Yan, M, Zhang, S, Hossain, T, Jin, N & Adesida, I 2008, 'On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm', IEEE Electron Device Letters, vol. 29, no. 8, pp. 867-869. https://doi.org/10.1109/LED.2008.2001123
Memis, Omer Gokalp ; Katsnelson, Alex ; Mohseni, Hooman ; Yan, Minjun ; Zhang, Shuang ; Hossain, Tim ; Jin, Niu ; Adesida, Ilesanmi. / On the source of jitter in a room-temperature nanoinjection photon detector at 1.55 μm. In: IEEE Electron Device Letters. 2008 ; Vol. 29, No. 8. pp. 867-869.
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