Abstract
The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.
| Original language | English |
|---|---|
| Pages (from-to) | 529-532 |
| Number of pages | 4 |
| Journal | Russian Microelectronics |
| Volume | 40 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Dec 1 2011 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry
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Cite this
Alekseev, A. M., Komkov, V. N., Krasnoborod'ko, S. Y., Shubin, A. B., & Shevyakov, V. I. (2011). Peculiarities of three-passage measurements in magnetic force microscopy. Russian Microelectronics, 40(7), 529-532. https://doi.org/10.1134/S106373971107002X