Peculiarities of three-passage measurements in magnetic force microscopy

A. M. Alekseev, V. N. Komkov, S. Yu Krasnoborod'ko, A. B. Shubin, V. I. Shevyakov

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.

Original languageEnglish
Pages (from-to)529-532
Number of pages4
JournalRussian Microelectronics
Volume40
Issue number7
DOIs
Publication statusPublished - Dec 2011
Externally publishedYes

Fingerprint

Magnetic force microscopy
Electrostatic force
magnetic force microscopy
electrostatics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics

Cite this

Alekseev, A. M., Komkov, V. N., Krasnoborod'ko, S. Y., Shubin, A. B., & Shevyakov, V. I. (2011). Peculiarities of three-passage measurements in magnetic force microscopy. Russian Microelectronics, 40(7), 529-532. https://doi.org/10.1134/S106373971107002X

Peculiarities of three-passage measurements in magnetic force microscopy. / Alekseev, A. M.; Komkov, V. N.; Krasnoborod'ko, S. Yu; Shubin, A. B.; Shevyakov, V. I.

In: Russian Microelectronics, Vol. 40, No. 7, 12.2011, p. 529-532.

Research output: Contribution to journalArticle

Alekseev, AM, Komkov, VN, Krasnoborod'ko, SY, Shubin, AB & Shevyakov, VI 2011, 'Peculiarities of three-passage measurements in magnetic force microscopy', Russian Microelectronics, vol. 40, no. 7, pp. 529-532. https://doi.org/10.1134/S106373971107002X
Alekseev, A. M. ; Komkov, V. N. ; Krasnoborod'ko, S. Yu ; Shubin, A. B. ; Shevyakov, V. I. / Peculiarities of three-passage measurements in magnetic force microscopy. In: Russian Microelectronics. 2011 ; Vol. 40, No. 7. pp. 529-532.
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