Peculiarities of three-passage measurements in magnetic force microscopy

A. M. Alekseev; V. N. Komkov; S. Yu Krasnoborod'ko; A. B. Shubin; V. I. Shevyakov

doi:10.1134/S106373971107002X

Peculiarities of three-passage measurements in magnetic force microscopy

A. M. Alekseev, V. N. Komkov, S. Yu Krasnoborod'ko, A. B. Shubin, V. I. Shevyakov

Laboratory of Advanced Solar Energy Materials and Systems

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.

Original language	English
Pages (from-to)	529-532
Number of pages	4
Journal	Russian Microelectronics
Volume	40
Issue number	7
DOIs	https://doi.org/10.1134/S106373971107002X
Publication status	Published - Dec 1 2011

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Access to Document

10.1134/S106373971107002X

Fingerprint Dive into the research topics of 'Peculiarities of three-passage measurements in magnetic force microscopy'. Together they form a unique fingerprint.

Cite this

@article{c0a977c6504f40be9ea0ec495b8714ff,

title = "Peculiarities of three-passage measurements in magnetic force microscopy",

abstract = "The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.",

author = "Alekseev, {A. M.} and Komkov, {V. N.} and Krasnoborod'ko, {S. Yu} and Shubin, {A. B.} and Shevyakov, {V. I.}",

year = "2011",

month = dec,

day = "1",

doi = "10.1134/S106373971107002X",

language = "English",

volume = "40",

pages = "529--532",

journal = "Russian Microelectronics",

issn = "1063-7397",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "7",

}

TY - JOUR

T1 - Peculiarities of three-passage measurements in magnetic force microscopy

AU - Alekseev, A. M.

AU - Komkov, V. N.

AU - Krasnoborod'ko, S. Yu

AU - Shubin, A. B.

AU - Shevyakov, V. I.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.

AB - The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.

UR - http://www.scopus.com/inward/record.url?scp=84855901022&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84855901022&partnerID=8YFLogxK

U2 - 10.1134/S106373971107002X

DO - 10.1134/S106373971107002X

M3 - Article

AN - SCOPUS:84855901022

VL - 40

SP - 529

EP - 532

JO - Russian Microelectronics

JF - Russian Microelectronics

SN - 1063-7397

IS - 7

ER -