Abstract
The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.
Original language | English |
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Pages (from-to) | 529-532 |
Number of pages | 4 |
Journal | Russian Microelectronics |
Volume | 40 |
Issue number | 7 |
DOIs | |
Publication status | Published - Dec 1 2011 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry