Peculiarities of three-passage measurements in magnetic force microscopy

A. M. Alekseev, V. N. Komkov, S. Yu Krasnoborod'ko, A. B. Shubin, V. I. Shevyakov

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The method of three-passage measurements in magnetic force microscopy is described, which yields refined magnetic images of nano and microobjects, and eliminates the possible parasitic influence of long-range electrostatic forces while obtaining a magnetic image.

Original languageEnglish
Pages (from-to)529-532
Number of pages4
JournalRussian Microelectronics
Volume40
Issue number7
DOIs
Publication statusPublished - Dec 1 2011

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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  • Cite this

    Alekseev, A. M., Komkov, V. N., Krasnoborod'ko, S. Y., Shubin, A. B., & Shevyakov, V. I. (2011). Peculiarities of three-passage measurements in magnetic force microscopy. Russian Microelectronics, 40(7), 529-532. https://doi.org/10.1134/S106373971107002X