Abstract
A photoelectrochemical etching process for n-type GaN using KOH solution and broad-area Hg arc lamp illumination is described. Etch rates as high as 320 nm/min are obtained. The etch rate is investigated as a function of light intensity for stirred and unstirred solutions. Preliminary results on etching of Al0.1Ga0.9N layers are reported.
Original language | English |
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Pages (from-to) | 349-354 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 468 |
DOIs | |
Publication status | Published - 1997 |
Externally published | Yes |
Event | Proceedings of the 1997 MRS Spring Symposium - San Francisco, CA, USA Duration: Apr 1 1997 → Apr 4 1997 |
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering