Fingerprint Dive into the research topics of 'Plasma-induced damage study for n-GaN using inductively coupled plasma reactive ion etching'. Together they form a unique fingerprint.
- Sort by
- Weight
- Alphabetically
Plasma-induced damage study for n-GaN using inductively coupled plasma reactive ion etching
F. A. Khan, L. Zhou, V. Kumar, I. Adesida
Research output: Contribution to journal › Article › peer-review
30
Citations
(Scopus)