PT-symmetric metamaterial systems for aberration-free imaging and wave manipulation

F. Monticone, C. Valagiannopoulos, S. Savoia, R. Fleury, A. Alu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We show that PT-symmetry concepts, combined with an effective nonlocal response, allow realizing all-angle negative refraction and aberration-free optical imaging. The designed PT-symmetric lens is an example of "absolute optical instrument", with similar imaging properties as DNG lenses, but without some of their drawbacks.

Original languageEnglish
Title of host publication2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages223-225
Number of pages3
ISBN (Print)9781479978366
DOIs
Publication statusPublished - Nov 30 2015
Externally publishedYes
Event9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015 - Oxford, United Kingdom
Duration: Sep 7 2015Sep 12 2015

Other

Other9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015
CountryUnited Kingdom
CityOxford
Period9/7/159/12/15

Keywords

  • Lenses
  • Metamaterials
  • Optical diffraction
  • Optical imaging
  • Optical refraction
  • Optical sensors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'PT-symmetric metamaterial systems for aberration-free imaging and wave manipulation'. Together they form a unique fingerprint.

  • Cite this

    Monticone, F., Valagiannopoulos, C., Savoia, S., Fleury, R., & Alu, A. (2015). PT-symmetric metamaterial systems for aberration-free imaging and wave manipulation. In 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015 (pp. 223-225). [7342581] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MetaMaterials.2015.7342581