Keyphrases
Adsorption Process
100%
Rod-like
100%
Reaction Method
100%
Ti-doped
100%
Ti Doping
100%
NO Gas Sensing
100%
Ti-doped ZnO Films
100%
ZnO Structures
100%
Scanning Electron Microscope Image
66%
Photoluminescence Spectroscopy
66%
NO Gas
66%
Pure Zn
66%
UV-VIS Spectroscopy
33%
High Density
33%
Early Detection
33%
Nanostructures
33%
High Specific Surface Area
33%
Sensor-based
33%
Highly Selective
33%
Crystallinity
33%
X-ray Diffraction Pattern
33%
Gas Sensing Applications
33%
X-ray Photoelectron Spectroscopy
33%
Stoichiometric Ratio
33%
Hexagonal Structure
33%
Short Response Time
33%
Sensing Performance
33%
Energy Dispersive X-ray Spectroscopy
33%
Carrier Concentration
33%
X-ray Diffraction Spectroscopy
33%
Transmittance
33%
Hall Measurement
33%
High Mobility
33%
Recovery Time
33%
Visible Region
33%
ZnO Thin Films
33%
Oxygen Vacancy
33%
Flower-like Structure
33%
Energy Band Gap
33%
Hexagonal Wurtzite
33%
Atomic Energy
33%
Ti Content
33%
Ionized Oxygen Vacancy
33%
High-Ti
33%
Brunauer-Emmett-Teller
33%
Area to Volume Ratio
33%
Doping Content
33%
Atomic Absorption
33%
Gas Leakage
33%
INIS
layers
100%
gases
100%
adsorption
100%
zinc oxides
100%
rods
100%
doped materials
100%
flowers
100%
films
55%
spectroscopy
22%
images
22%
sensors
22%
oxygen
22%
x-ray diffraction
22%
scanning electron microscopy
22%
photoluminescence
22%
vacancies
22%
energy
11%
nanostructures
11%
performance
11%
applications
11%
surfaces
11%
density
11%
indoors
11%
concentration
11%
detection
11%
recovery
11%
stability
11%
compacts
11%
volume
11%
mobility
11%
porous materials
11%
thin films
11%
host
11%
leakage
11%
specific surface area
11%
x radiation
11%
absorption
11%
outdoors
11%
carriers
11%
stoichiometry
11%
x-ray spectroscopy
11%
atomic energy
11%
Engineering
Adsorption
100%
Rod
100%
Oxygen Vacancy
66%
Energy Engineering
33%
Response Time
33%
Sensing Application
33%
Early Detection
33%
Thin Films
33%
Specific Surface Area
33%
Ray Diffraction
33%
Crystallinity
33%
X-Ray Diffraction Pattern
33%
Photoelectron
33%
Sensing Performance
33%
Carrier Concentration
33%
Volume Ratio
33%
Recovery Time
33%
Band Gap Energy
33%
Gas Leakage
33%
Material Science
ZnO
100%
Film
55%
Photoluminescence
22%
Scanning Electron Microscopy
22%
X-Ray Diffraction
22%
Oxygen Vacancy
22%
Density
11%
Nanocrystalline Material
11%
Thin Films
11%
Diffraction Pattern
11%
Energy-Dispersive X-Ray Spectroscopy
11%
Carrier Concentration
11%