Secondary Electron Yield of Emissive Materials for Large-Area Micro-Channel Plate Detectors

Surface Composition and Film Thickness Dependencies

Slade J. Jokela, Igor V. Veryovkin, Alexander V. Zinovev, Jeffrey W. Elam, Anil U. Mane, Qing Peng, Zinetula Insepov

Research output: Contribution to journalConference article

30 Citations (Scopus)

Abstract

The ongoing development of Atomic Layer Deposition (ALD) enables the use of relatively inexpensive and robust borosilicate micro-channel substrates for use as Micro-Channel Plates (MCPs). The surfaces of the channels in these glass plates are functionalized to control the conductivity as well as the Secondary Electron Yield (SEY). The extensive SEY data found in literature show significant variation for a given material depending on the apparatus, the measurement procedure, and the sample preparation and handling. We present systematic studies on the effects of film thickness and surface chemical composition on SEY. We have modified an existing ultra-high vacuum apparatus containing X-ray and Ultraviolet Photoelectron Spectrometers (XPS and UPS, respectively) by adding a modified Low Energy Electron Diffraction (LEED) module for SEY measurements. With these tools, we have characterized the secondary electron emissive properties for MgO, Al2O3, and multilayered MgO/TiO2 structures to serve as electron emissive layers in the channels of the MCPs.

Original languageEnglish
Pages (from-to)740-747
Number of pages8
JournalPhysics Procedia
Volume37
DOIs
Publication statusPublished - Jan 1 2012
Event2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 - Chicago, United States
Duration: Jun 9 2011Jun 14 2011

Fingerprint

microchannel plates
film thickness
detectors
electrons
vacuum apparatus
atomic layer epitaxy
ultrahigh vacuum
chemical composition
photoelectrons
electron diffraction
modules
spectrometers
conductivity
preparation
glass
x rays

Keywords

  • Aluminum Oxide
  • Atomic Layer Deposition
  • Magnesium Oxide
  • Secondary Electron Yield
  • XPS

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Secondary Electron Yield of Emissive Materials for Large-Area Micro-Channel Plate Detectors : Surface Composition and Film Thickness Dependencies. / Jokela, Slade J.; Veryovkin, Igor V.; Zinovev, Alexander V.; Elam, Jeffrey W.; Mane, Anil U.; Peng, Qing; Insepov, Zinetula.

In: Physics Procedia, Vol. 37, 01.01.2012, p. 740-747.

Research output: Contribution to journalConference article

Jokela, Slade J. ; Veryovkin, Igor V. ; Zinovev, Alexander V. ; Elam, Jeffrey W. ; Mane, Anil U. ; Peng, Qing ; Insepov, Zinetula. / Secondary Electron Yield of Emissive Materials for Large-Area Micro-Channel Plate Detectors : Surface Composition and Film Thickness Dependencies. In: Physics Procedia. 2012 ; Vol. 37. pp. 740-747.
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