Smoothing RF cavities with gas cluster ions to mitigate high voltage breakdown

D. R. Swenson; E. Degenkolb; Z. Insepov; L. Laurent; G. Scheitrum

doi:10.1016/j.nimb.2005.07.107

Smoothing RF cavities with gas cluster ions to mitigate high voltage breakdown

D. R. Swenson, E. Degenkolb, Z. Insepov, L. Laurent, G. Scheitrum

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Many studies have demonstrated that improving the surface smoothness and cleanliness of high voltage electrodes increases the voltage standoff capability, but none have specifically investigated the role of nano-scale and atomic level surface roughness. Using AFM imaging, we have studied the effect of gas cluster ion beams (GCIB) on oxygen-free Cu electrode material that is used in high gradient RF cavities. Using Ar clusters accelerated by 30 kV, with a dose of 6 × 10¹⁴ e cm^-2, we have effectively removed an asperity that was 3500 Å wide and 350 Å high. Subsequent processing with 5 kV acceleration reduced the surface roughness from an Ra value of 13.2 Å to 4.8 Å. This demonstrates the effectiveness of GCIB for reducing sub-micron roughness to atom level smoothness.

Original language	English
Pages (from-to)	641-644
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	241
Issue number	1-4
DOIs	https://doi.org/10.1016/j.nimb.2005.07.107
Publication status	Published - Dec 1 2005
Externally published	Yes

Keywords

Cluster beam
Cluster-surface interactions
Kilpatrick limit
RF breakdown

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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Smoothing RF cavities with gas cluster ions to mitigate high voltage breakdown. / Swenson, D. R.; Degenkolb, E.; Insepov, Z.; Laurent, L.; Scheitrum, G.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 241, No. 1-4, 01.12.2005, p. 641-644.

Research output: Contribution to journal › Article › peer-review

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