Specific features of the optical and electrical properties of polycrystalline CdTe films grown by the thermal evaporation method

V. V. Brus, M. N. Solovan, E. V. Maistruk, I. P. Kozyarskii, P. D. Maryanchuk, K. S. Ulyanytsky, J. Rappich

Research output: Contribution to journalArticlepeer-review

31 Citations (Scopus)

Abstract

The results of studying the physical properties of thin CdTe films obtained by the thermal evaporation method have been presented. The optical constants and the band gap of the films under study have been determined (Eg = 1.46 eV). It has been established based on the investigation of optical properties and the Raman spectrum of the films that they possess high structural quality. The activation energy of the electrical conductivity of CdTe films has been determined: Ea = 0.039 eV. The measured spectral dependences of the impedance of CdTe thin films are characteristic of the inhomogeneous medium with two time constants: τgb = RgbCgb = 1/ωgb = 1.62 × 10−3 s and τg = RgCg = 1/ωg = 9.1 × 10−7 s for grain boundaries and grains, respectively.

Original languageEnglish
Pages (from-to)1947-1951
Number of pages5
JournalPhysics of the Solid State
Volume56
Issue number10
DOIs
Publication statusPublished - Oct 10 2014
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Specific features of the optical and electrical properties of polycrystalline CdTe films grown by the thermal evaporation method'. Together they form a unique fingerprint.

Cite this