Surface processing with ionized cluster beams: computer simulation

Z. Insepov, I. Yamada

Research output: Contribution to journalConference articlepeer-review

37 Citations (Scopus)

Abstract

Molecular Dynamics (MD) and Monte Carlo (MC) models of energetic gas cluster irradiation of a solid surface have been developed to investigate the phenomena of crater formation, sputtering, surface treatment, and the material hardness evaluation by irradiation with cluster ions. Theoretical estimation of crater dimensions formed with Ar gas cluster ion irradiation of different substrates, based on hydrodynamics and MD simulation, are presented. The atomic scale shock waves arising from cluster impact were obtained by calculating the pressure, temperature and mass-velocity of the target atoms. The crater depth is given as a unique 1/3 dependence on the cluster energy and on the cold material Brinell hardness number (BHN). A new 'true material hardness' scale which can be very useful for example for thin film coatings deposited on a soft substrate, is defined. This finding could be used as a new technique for measuring of a material hardness. Evolution of surface morphology under cluster ion irradiation was described by the surface relaxation equation which contains a term of crater formation at cluster impact. The formation of ripples on a surface irradiated with oblique cluster ion beams was predicted. MD and MC models Decaborane ion (B10H14) implantation into Si and the following rapid thermal annealing (RTA) have been developed.

Original languageEnglish
Pages (from-to)199-208
Number of pages10
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume153
Issue number1-4
DOIs
Publication statusPublished - Jun 1999
Externally publishedYes
EventProceedings of the 1998 4th International Conference on Computer Simulation of Radiation Effects in Solids (COSIRES) - Okayama, Jpn
Duration: Sep 15 1998Sep 19 1998

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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