It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.
|Number of pages||7|
|Journal||Proceedings of The International Symposium on Multiple-Valued Logic|
|Publication status||Published - Sep 20 2005|
|Event||35th International Symposium on Multiple-Valued Logic, ISMVL 2005 - Calgary, Alta., Canada|
Duration: May 19 2005 → May 21 2005
ASJC Scopus subject areas
- Computer Science(all)