Test generation and fault localization for quantum circuits

Marek Perkowski, Jacob Biamonte, Martin Lukac

Research output: Contribution to journalConference articlepeer-review

31 Citations (Scopus)


It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.

Original languageEnglish
Pages (from-to)62-68
Number of pages7
JournalProceedings of The International Symposium on Multiple-Valued Logic
Publication statusPublished - Sept 20 2005
Event35th International Symposium on Multiple-Valued Logic, ISMVL 2005 - Calgary, Alta., Canada
Duration: May 19 2005May 21 2005

ASJC Scopus subject areas

  • General Computer Science
  • General Mathematics


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