Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices

Walid El-Deeb, Mohammad Hashmi, Souheil Bensmida, Fadhel Ghannouchi

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)
Original languageEnglish
Pages (from-to)1773
Number of pages1781
JournalIET Microwaves, Antennas and Propagation
Volume4
Issue number11
Publication statusPublished - Nov 2010

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