Original language | English |
---|---|
Pages (from-to) | 1773 |
Number of pages | 1781 |
Journal | IET Microwaves, Antennas and Propagation |
Volume | 4 |
Issue number | 11 |
Publication status | Published - Nov 2010 |
Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices
Walid El-Deeb, Mohammad Hashmi, Souheil Bensmida, Fadhel Ghannouchi
Research output: Contribution to journal › Article › peer-review
10
Citations
(Scopus)