Toward the matrix polarimetry method of thin film coatings

L. J. Pidkamin, A. D. Arkhelyuk, V. V. Brus

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The results obtained from studying the impact of optical-geometrical parameters of thin-layered models containing the particles of different shapes and sizes as well as the degree of orient ability toward their light scattering matrices how been analyzed. A special emphasis is placed upon the peculiar aspects of the matrix polarymetry method and it is in fact expedient to use this technique in implementing and developing the non-destructive methods to control thin film coatings.

Original languageEnglish
Title of host publicationCriMiCo 2011 - 2011 21st International Crimean Conference
Subtitle of host publicationMicrowave and Telecommunication Technology, Conference Proceedings
PublisherIEEE Computer Society
Pages727-728
Number of pages2
ISBN (Print)9789663353562
Publication statusPublished - 2011
Externally publishedYes
Event2011 21st International Crimean Conference: Microwave and Telecommunication Technology,CriMiCo 2011 - Sevastopol, Crimea, Ukraine
Duration: Sep 12 2011Sep 16 2011

Publication series

NameCriMiCo 2011 - 2011 21st International Crimean Conference: Microwave and Telecommunication Technology, Conference Proceedings

Conference

Conference2011 21st International Crimean Conference: Microwave and Telecommunication Technology,CriMiCo 2011
CountryUkraine
CitySevastopol, Crimea
Period9/12/119/16/11

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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