Unified Model for Contrast Enhancement and Denoising

Alex Pappachen James, Olga Krestinskaya, Joshin John Mathew

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)


In this paper, we attempt a challenging task to unify two important complementary operations, i.e. contrast enhancement and denoising, that is required in most image processing applications. The proposed method is implemented using practical analog circuit configurations that can lead to near real-time processing capabilities useful to be integrated with vision sensors. Metrics used for performance includes estimation of Residual Noise Level (RNL), Structural Similarity Index Measure (SSIM), Output-to-Input Contrast Ratio (CRo-i), and its combined score (SCD). The class of contrast stretching methods has resulted in higher noise levels (RNL ≥ 7) along with increased contrast measures (CRo-i ≥ eight times than that of the input image) and SSIM ≤ 0.52. Denoising methods generates images with lesser noise levels (RNL ≤ 0.2308), poor contrast enhancements (CRo-i ≤ 1.31) and with best structural similarity (SSIM ≥ 0.85). In contrast, the proposed model offers best contrast stretching (CRo-i = 5.83), least noise (RNL = 0.02), a descent structural similarity (SSIM = 0.6453) and the highest combined score (SCD = 169).

Original languageEnglish
Title of host publicationProceedings - 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)9781509067626
Publication statusPublished - Jul 20 2017
Externally publishedYes
Event2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017 - Bochum, North Rhine-Westfalia, Germany
Duration: Jul 3 2017Jul 5 2017


Conference2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017
CityBochum, North Rhine-Westfalia


  • Analog Circuits
  • Contrast Enhancement
  • Denoising
  • Filter

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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