Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM

Kazybek Adam, Kamilya Smagulova, Olga Krestinskaya, Alex James Pappachen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM'. Together they form a unique fingerprint.

Engineering & Materials Science