Y-Net: Insect Counting and Segmentation using Deep Learning on Embedded Devices

Amin Kargar, Dimitrios Zorbas, Michael Gaffney, Brendan O'Flynn, Salvatore Tedesco

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Insect pests can pose a serious threat to food production and agriculture in general and can cause substantial crop damage and economic losses. Monitoring insect pest populations is essential to control and mitigate these losses. Traditional monitoring methods are considered by growers and agronomists to be time-costly as well as labour-intensive tasks, which ultimately means that in times of high activity on farms it is a task which often is neglected. This study proposes an automated vision-based insect segmentation and counting approach through the use of deep learning (DL) models developed particularly for embedded systems. An image dataset for our target insect, Halyomorpha halys, was first created using images captured by our IoT-enabled image capture system deployed in a fruit orchard. Then, a Y-Net model inspired by U-Net was developed with the capability of insect counting in addition to segmentation. The performance of this model was assessed using a variety of different metrics, and the results demonstrated the feasibility and effectiveness of the model in counting and segmentation of insects using Edge-AI algorithms capable of running on embedded systems. Based on the achieved results, the proposed Y-Net model achieved a Mean Squared Error (MSE) of 1.9 for the insect counting task, an Intersection over Union (IoU) of 84.5% and a Dice Similarity Coefficient (DSC) of 91.5% for the segmentation task, with an inference time of nearly 0.4 seconds on a smartphone.

Original languageEnglish
Title of host publicationI2MTC 2024 - Instrumentation and Measurement Technology Conference
Subtitle of host publicationInstrumentation and Measurement for Sustainable Future, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350380903
DOIs
Publication statusPublished - 2024
Event2024 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024 - Glasgow, United Kingdom
Duration: May 20 2024May 23 2024

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (Print)1091-5281

Conference

Conference2024 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024
Country/TerritoryUnited Kingdom
CityGlasgow
Period5/20/245/23/24

Keywords

  • CNN-based architecture
  • Deep learning
  • Image segmentation
  • Insect monitoring
  • Object counting
  • Precision agriculture

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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