Far field imaging of a dielectric inclusion

Abdul Wahab; Naveed Ahmed; Tasawar Abbas

doi:10.1088/1742-6596/657/1/012001

Far field imaging of a dielectric inclusion

Abdul Wahab
, Naveed Ahmed
, Tasawar Abbas

Department of Mathematics

COMSATS University Islamabad
Weierstrass Institute for Applied Analysis and Stochastics
International Islamic University Islamabad

Результат исследований › рецензирование

1 Цитирования (Scopus)

Аннотация

A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.

Язык оригинала	English
Номер статьи	012001
Журнал	Journal of Physics: Conference Series
Том	657
Номер выпуска	1
DOI	https://doi.org/10.1088/1742-6596/657/1/012001
Состояние	Published - нояб. 16 2015
Событие	5th International Workshop on New Computational Methods for Inverse Problems, NCMIP 2015 - Cachan Продолжительность: мая 29 2015 → …

ASJC Scopus subject areas

General Physics and Astronomy

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10.1088/1742-6596/657/1/012001

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DO - 10.1088/1742-6596/657/1/012001

M3 - Conference article

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Far field imaging of a dielectric inclusion

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